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The High-Voltage Monolithic Active Pixel Sensor for the Mu3e Experiment

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The High-Voltage Monolithic Active Pixel Sensor for the

Mu3e Experiment

Shruti Shrestha

On Behalf of the Mu3e Collaboration

!

International Conference on

Technology and Instrumentation in Particle Physics

2-6 June, 2014

(2)

Outline

The decay μ→eee

The Mu3e Experiment

The Mu3e Pixel Detector based on HV-MAPS

Results from Test Beam at DESY 2013/2014

(3)

Motivation

The Mu3e experiment searches for :

Lepton flavor violation in the decay of μ

+

→e

+

e

+

e

-

with a sensitivity of BR < 10

-16

Four orders of magnitude improvement over the most stringent limit to date

In the SM, the decay is

suppressed to unobservable levels (BR< 10

-54

)

Any observed signal event is a clear signature of

new phenomena beyond the SM

(4)

Motivation

The experiment allows to test models involving new particles

Supersymmetry

Extended Higgs models

Heavy vector bosons

!

!

!

!

Supersymmetry LFV at tree level

(5)

Signal and Backgrounds

Decay signature: Muon decays at rest

Two positrons and an electron

Opposite curvature in magnetic field

Coincident in time, originating from same vertex

Momentum conservation:

Energy conservation:

Individual energies are below 53 MeV

(6)

Signal and Backgrounds

Internal Conversion ( Radiative muon decay)

!

!

!

Combinatorials

!

Precise timing, good momentum and vertex resolution required Good momentum and total

energy resolution required

(7)

Mu3e Experiment

!

!

!

!

To achieve sensitivity goal:

109 muon decays/s

excellent vertex resolution

excellent time resolution

Low pT < 53 MeV/c decay product, track resolution dominated by multiple scattering.

High granularity Si- based tracking detector made of HV-MAPS

(8)

HV-MAPS

HV-MAPS as a particle detector

Based on 180 nm HV-CMOS technology

Fast charge collection (<100 ps) via drift, results in high radiation tolerance

Thinning to < 50 μm

Power consumption ~ 7.5 μW/pixel

Relatively cheap due to use of commercial process

DeD

!!

Deep N Well

I I I I

Depleted Region ~9 μm P Substrate

-60V 1.8V

(9)

HV-MAPS

Low doped deep N- well as signal collecting region

Depleted p-n junction as a sensor ~ 9 μm

The charge collected by drift

~625 e in depleted region using Sr

90

as a source

Entire pixel electronics

CMOS transistors inside the deep N-well

Integrated readout electronics

N- well are in matrix, depleted

zones overlapped ~ 100% fill factor

DeD

!!

Deep N Well

I I I I

P Substrate -60V 1.8V

Depleted Region ~9 μm

(10)

MUPIX4

Features : AMS 180nm process

Pixel Matrix: 40x32 pixels, 80x92 μm2 (pixel size) Active area : 9.4 mm2

Moderate substrate resistivity ~10 Ω cm

Designed by Ivan Peric (U. Heidelberg
 Institute for Computer Science (ZITI)

Analog part: Small pixel capacitance Temperature tolerance

Digital part: Zero suppression Mostly Ready Feature: pixel address problem in half column Fixed in MUPIX6 using inverters

40 Rows/ 3.20mm

32 Columns/ 2.94mm

(11)

HV-MAPS: Integrated readout electronics

!

!

Concept: Each pixel has its own read out (RO) cell placed on the chip periphery

RAM/ROM

Hit flag

Priority scan logic

Time stamp Data bus Comparator Read

and Thr tune DAC

Pixel contains a charge sensitive amplifier

Row/Col Addr + TS

Readout cell function:

Time stamp Hit data

Priority logic

Binary Suppressed read out

RO cell size is 7μm x 40 μm in 180nm AMS process (with comparator and threshold tune DAC)

32 columns

40 Rows

10 Rows RO cells

(12)

Test Beam set up at DESY

DESY Test Beam set up

Beam-line T22

1 GeV to 6 GeV electrons

EUDET Telescope

MUPIX4 prototype

!

!

electron beam

MUPIX4

Beam Telescope

(13)

Test Beam Results

(14)

Time and Single Hit Resolution

Incident angle: 0o!

High Voltage : 70 V!

Threshold : 823 mV

Result: Resolution given by pixel size Measured track residuals:

RMS x = 28 μm, RMS y = 29 μm

Result: Time Resolution : 17 ns (Sensor and DAQ)

External Gray counter at 100 MHz

(15)

Pixel Efficiency

Incident angle: 0o!

High Voltage : 70 V!

Threshold : 823 mV

Pixel Efficiency Pixel Efficiency

Result: Rotated chip with 45 degree

angle, higher efficiency

! Result: First working prototype

Efficiency > 99% for untuned DAC !

Threshold [mV]

825 830 835 840 845 850

Efficiency

0.96 0.965 0.97 0.975 0.98 0.985 0.99 0.995 1

Column matched efficiencies, 70 V

Rotated by 45 deg Rotated by 22.5 deg No rotation

(16)

Conclusion

Mu3e experiment aims for μ→e

+

e

+

e

-

with sensitivity of BR < 10

-16

HV-MAPS has been implemented for fast charge

collection efficiency, radiation hardness, and minimum material

Looking forward to integrate full digital electronics in the Mu3e pixel prototype by end of this year

The MUPIX4 has already the required analog performance

Currently, the performance of MUPIX6 is being tested at

PSI

(17)

Backup slides

(18)

Mechanical prototype and sandwich Design

HV-MAP

Thinned to 50 μm

sensor size 1 x 2 cm2 or 2x2 cm2 KaptonTM flex print

25 μm KaptonTM 12.5 μm Al traces

KaptonTM Frame Modules 25 μm foil

self support

<0.1% X0 per layer

(19)

Thinned sensor

Reference <90 μm

PSI test beam

Result: No significant difference in pulse shape

~300 μm

(20)

Temperature stability

Latency measurement

LED pulse to a pixel discriminator output

!

!

!

!

Result: Temperature dependence within

the resolution setup

(21)

Result after 380MRad radiation and ~ 8x10 15 n eq cm -2

Perform: Irradiation at PS (CERN) for 180 nm HV CMOS

!

!

!

!

Result: The chip works, particles are measured when the chip is in the beam

Courtesy: RESMDD 2012, Ivan Peric

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