3.1. THE DATA SHEET
The transistor circuit designer must rely heavily upon the manufacturer's data sheets for device information. It is therefore the manufacturer's responsibility to present extensive design data in the simplest possible form.
Considerable thought goes into the layout of today's well-prepared, informative data sheet. This section presents a general discussion of Texas Instruments data sheets, detailing the information normally given and where it may be found. In Chaps. 4, 5, and 6, each parameter normally found on a data sheet is discussed in detail. IRE symbol notation for transistors and their associated circuitry is also presented.
Data sheets published by Texas Instruments normally consist of eight sections.
A brief description of the device is given, followed by sections on environmental tests, mechanical data, absolute ratings, electrical characteristics, and typical char-acteristic curves. Typical application data and parameter measurement information are usually included.
A typical Texas Instruments data sheet is reproduced here. Its numbered parts are analyzed as follows:
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N·P·N TYPES 2N1302, 2N1304, 2N1306, AND 2N1308 ~ P·N·P TYPES 2N1303, 2N1305, 2N1307, AND 2N1309
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Transistor Specifications 25
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Description. The general classification of the transistor or series is given first. This includes device number, material type, whether NPN or PNP, the basic construction technique used in fabrication, the general purpose for which the device was designed, and its outstanding characteristics. From this description, the designer can quickly determine whether the transistor or transistor series is generally suitable for his application. From this point on, however, the job of selecting a specific transistor for a particular purpose involves consideration of all electrical ratings and characteristics to make sure that the transistor fits the application in every regard.®
Environmental Tests. The information presented here concerns those tests to which finished devices are subjected before thorough testing for rigid adherence to specified characteristics. The tests most often specified are temperature cycling, aging, stabilization, and mechanical shock testing. In some cases, a particular production process or expected device use dictates additional tests.Transistors are subjected to these tests to ensure maximum integrity, stability, and long life. The information is presented to indicate to the user the physical ruggedness of the device.
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Mechanical Data. Mechanical data includes package description as to case type, unit weight, an outline drawing with dimensions, terminal identification, any additional fabrication information, and a statement as to which electrode (if any) is connected to the case.@) Absolute Maximum Ratings. Absolute maximum ratings are those ratings established by the manufacturer, beyond which degradation of a transistor may occur. These ratings are based on the semiconductor material, manufacturing processes, and internal physical construction. Test conditions are usually not shown for these ratings. Since these ratings represent the extreme capabilities of a transistor, they are not recommended as design conditions. The transistor will not necessarily withstand all maximum rating conditions simultaneously.
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Electrical Characteristics. This is the portion of the data sheet to which the designer will most often refer. Here he will find the limits to the electrical parameters necessary for a particular circuit design. These limits are guaranteed, and are specified as maximum and/or minimum limits. To prevent any chance of misunderstanding, complete test conditions are specified for every parameter.In addition to minimum and maximum parameter limits, a typical value is often shown. This value is not guaranteed. nor is it required on the data sheet. It merely gives the user an indication of where the mean of a distribution is located when that particular parameter is measured on a very large number of units.
Electrical characteristics are defined as measurable properties of the device which are inherent in its design. Consequently, quantities such as power gain, noise figure, switching times-which are circuit-de pendent-are not included under Elec-trical Characteristics, but rather under Operating or Switching Characteristics.
Inasmuch as the numerical values of these characteristics are circuit-dependent, a test circuit is included on the data sheet in the section entitled Parameter Measure-ments Information. In general, these parameters are measured at nominal current and voltage values, since exact values vary slightly with device parameters.
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Typical Characteristics (Curves). These curves are usually included, to show the variance of particular parameters with changes in temperature, voltage, and current. The curves are typical, and they conform to information given else-where on the data sheet, especially data shown as Electrical, Switching, and Oper-ating Characteristics. Often included are thermal characteristics, which include a dissipation derating curve and possibly curves showing junction temperature response as a function of pulse width and duty cycle.o
Typical Application Data. Practical circuit diagrams and typical perform-ance data are usually included on the data sheet. These circuits always correspond to the intended application of the transistor, and are intended to indicate device capabilities as well as to provide the user with practical circuits.®
Parameter Measurements Information. This section presents circuits necessary to test the parameters included in the Operating or Switching Character-istics section of the data sheet. Circuit test conditions are specified. Every parameter listed on a data sheet is subject to variation among manufacturers because of difficult test conditions; this information is provided to help minimize correlation problems.Conclusion. Although much information may be included on a data sheet, it is obvious that the manufacturer must leave much unsaid. Information is included only after a careful appraisal of market requirements, in which cost to the user i~
the prime consideration. A conscientious manufacturer strives to present those parameters which he knows to be most important to the design engineer, and he strives to present them in the most usable manner.
3.2. TRANSISTOR NUMBERING SYSTEMS
TI Standard Devices. A standard TI device is one that is in production but has not been registered with the Joint Electron Device Engineering Council (JEDEC).
The number assigned to a standard TI device consists of the prefix TI and a sequential number of not more than four digits (e.g., TI 2062).
TI Special Devices. A special device is one that deviates from the product data sheets and/or the JEDEC registration specifications in any detail.
The number assigned to a special device consists of a two-letter prefix and a sequential four- or five-digit number:
SM 1234
Material
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Sequential numberG-Germanium S-Silicon
A-Alloy (Preferably four digits) C-Consumer
J -Grown junction M-Mesa-planar P-Power
S-Special products
Transistor Specifications 27 TI Development Devices. A development device is one that is in a preproduc-tion stage. The number assigned to a development device consists of TIX and a sequential number of not more than four digits (e.g., TIX 2061). (When a development device becomes a standard TI device, the X is dropped from the prefix.) JEDEC Type Numbers. A JEDEC type number indicates that a device has been registered with JEDEC. The purpose of registration is to facilitate the purchase and distribution of semiconductor devices by nontechnical individuals, and to provide standardization in the field of electronic devices. Registration procedures are designed to ensure that devices which differ from one another in performance are identified by different type numbers. Type numbers are assigned in numerical sequence as they are requested. INXXX numbers usually denote diodes or recti-fiers, 2NXXX numbers usually denote triode devices, and 3NXXX numbers usually denote tetrodes.
The semiconductor section of JEDEC is administered by the Semiconductor Device Council, which consists of eight members chosen by the Electronic Industries Association and the National Electrical Manufacturers Association. The council receives policy direction from them. The council formulates the policies and procedures that are followed in assignment of type designations and standardization of electronic devices. The standardization work is carried out in the product committees set up by the council.
One of the essential programs of the Semiconductor Device Council is type registration. The type registration is directed by the type administrator, head of the EIA Standards Laboratory in Newark, N.J. Registration consists of assignment of type numbers, recording of the assignment and the defining data, and releasing of the registration data to the entire electronics industry.
For further information concerning registration, consult JEDEC Pub!. 15, Type Designation and Registration Procedures for Semiconductor Devices.
Other JEDEC publications particularly useful to design engineers are:
Summary of Registered Crystal Diodes, JEDEC Pub!. 3.
Summary of Registered Transistors, JEDEC Pub!. 6.
Summary of Registered Bases and Outlines for Semiconductor Devices, JEDEC Publ. 12.
Electronics Industries Association recommended standards, specifications and engineering publications may be obtained from
EIA Engineering Office Room 2260
11 West 42d Street New York 36, New York at the prices indicated in their list.
3.3. MILITARY SPECIFICATIONS
The military services require that transistors they purchase, and those used in equipment they purchase, be of a type they approve procured to specifications they
publish. These specifications define the parameters to be measured, the acceptable limits, the environmental and life tests to be performed, and the statistical sampling plan to be used. Government contractors are also directed to use the specifications to specify parts for government equipment. Each of the military services has a branch which issues such specifications.
A transistor procured to these specifications is identified by the letters USA, USN, or USAF stamped on the device. When a transistor type is used by more than one service and the specification has their concurrence, the specifications issued by the Armed Services Electro-Standards Agency and the transistor bear a JAN designation.
Military specifications covering transistors are designated MIL-T- or MIL-S-19500.
Military transistor types differ from regular commercial devices in that they have demonstrated capability of passing many severe environmental tests such as shock, vibration, high G-Ievel centrifuge, temperature cycling, moisture resistance, and usually both storage and operational life tests. These tests are required to assure that the transistor will continue to operate satisfactorily despite severe military service.
Military transistor types may be procured only from qualified suppliers who have demonstrated, by qualification testing, their ability to meet the specification require-ments. Furthermore, these military types can be furnished only for use in military equipment; they are not available for commercial uses.