Error
Routine Code FIIIIIIICtiom T es:t!ed
X6F4
XXX X
where x = 0 If the rtn is not to be looped without respecifying the manual input.x = 1 If the rtn is to be looped without respecifying the manual input.
y = 0 If internal 2400 bps clock is to be used.
Note: This option is valid only for 2400 bps.
y = 8 If external clock is to be used.
z = 0 If the line set is jumpered for nonswitched half-duplex operation.
z = 1 If the line set is jumpered for switched operation.
z = 2 If the line set is jurnpered for nonswitched full-duplex operation.
At stop F056, enter the xrnt line adr.
Switch BCD E
o
X X X XXX is the xmt line adr as defined in the F001 manual intervention stop code.At stop F057, enter the rcv line adr.
Switch BCD E
o
X X X XXX is the rcv line adr as defined in the F001 manual intervention stop code.( ( (
Suspected
Card location
(5)Program
Mask
(
FEAlD Page
At manual intervention stop F059, disconnect the external wrap facility. This stop code will be bypassed if the loop option was specified in response to manual intervention stop code F055.
(
Error stops in this rtn, except for the set mode pretest errors (1 X03 and 1 X041. are most likely caused by failures in the line set cards if the other type 2 scanner rtn have run successfully. Refer to logic page VAOOO for line set card locations. Anyone of the three cards of the line set could be causing the error as no attempt is made by this rtn to isolate failures any further.
OX05 OTE controlled not ready state
1
12 bit times after the rcv line was initialized an alternating bit pattern was not detected in the SOF.Note: Error OX05 will occur only if switched and external clock options are specified.
OX07 OTE ready state
OX08 OSR active on the xmt side.
10 bit times after OTR was set on the xmt line, all 1's were not detected in the SOF of the rcv line.
OSR on the xmt side was not active.
Note: Error OX08 will occur only if nonswitched duplex or switched option is specified.
OX09 OXOB
'OSR' active on the rcv side.
'OSA' on the rcv line stays active at least 12 bit times after diag mode is set on the xmt line.
OXOC 'OSA' on the rcv line becomes inactive 22 bit times after diag mode is set on the xmt line.
'OSA' on the rcv side was not active.
'OS A' became inactive on the rcv line too soon after 'diag mode' was set on the xmt line.
'OSA' on the rcv line was still active 22 bit times after diag mode on the xmt line should have forced 'ctrl' and 'xmt' and, therefore, 'indicate' and 'rcv' on the rcv side to O's.
OXOD A bit pattern for a SDLC flag is generated on the rcv line after 'OSA' A SOLC flag bit pattern was not detected in the SOF within 20 bit
OXOE
OX12
becomes inactive. times after 'OSR' became inactive.
Note: Error OXOO will occur only if the switched option was specified.
A bit pattern for an ASCII SYN is generated on the rcv line after An ASCII SYN bit pattern was not detected in the SOF within at
'DSR' became inactive. least 20 bit times after the SOLC flag bit pattern was detected.
Note: Error OXOE will occur only if the switch option was specified.
All marks generated by the xmt line and rcv when diag mode is reset and 'OTA' is set on the xmt line. Oata rate select is also set at this time, but it should have no effect because 'RTS' is off.
All marks were not detected in the rcv line's SOF 10 bit times after the set mode irpt from the xmt line.
FETMM Page
( ( (
Comments
(
Error
Suspected
Card Program FEALD FETMMRoutine Code
Function T es:ted
Error Descrilption Location(s) Mask Page PageComments
X6F4 OX13 'Indicate' is inactive on the rcv line when 'RTS' is inactive on the 'Indicate' is active on the line before 'RTS' has been activated on the
xmt line. xmt line.
OX15 'CTS' is inactive on the xmt line when 'RTS' is inactive on the xmt 'CTS' is active on the xmt line before 'RTS' has been activated on the
line. xmt line.
OX18 'Indicate' becomes active on the rcv line when 'CTS' is activated on 'Indicate' did not become active on the rcv line after 'RTS' was
acti-the xmt line. vated on the xmt line.
OX19 'CTS'delay 'CTS' became active less than 21 bit times after 'RTS' was set in the line set ('Indicate' detected on the rcv line).
Note: Error OX19 will occur only if the delay option was specified.
OX20 :CTS' becomes active after 'RTS' is activated 'CTS' did not become active within one scan time with no delay, 31 bit times with delay after 'RTS' was set in the line set ('Indicate' detected on the rcv side).
OX21 Call request state All O's were not detected in the rcv line's SDF when 'RTS', data rate select, and 'DTR' are on in the xmt line.
Note: Error OX21 will occur only if the switched option is specified.
OX22
I
'DSR' stays active on the xmt line when 'Indicate' is active and the 'DSA' became inactive on the xmt line while a continuous space was rcv data line is held at space for at least 20 bit times. being rcv when 'Indicate' was active ('RTS' active on the xmt line).Note: Error OX22 will occur only if the nonswitched duplex or switc ed option is specified.
OX23 'DSA' stays active on the rcv line when 'Indicate' is active and the 'DSR' becomes inactive on the rcv line while a continuous space was rcv data line is held at space for at least 20 bit times. being rcv when 'Indicate' was active ('RTS' active on the xmt line).
OX25 'DSR'stays active on the xmt line at least 12 bit times after 'diag 'DSR' became inactive on the xmt .Iine too soon after 'diag mode' was
mode' is set on the xmt line. set on the xmt line.
Note: Error OX25 will occur only if the nonswitched duplex or switc ed option is specified.
OX26 'DSR' becomes inactive on the xmt line 22 bit times after 'diag 'DSR' on the xmt line was still active 22 bit times after 'diag mode' mode' is set on the xmt line. on the xmt line should have forced C and T and, therefore,
I and R on the rcv side to O's.
Note: Error OX26 will occur only if the nonswitched duplex or switc ed option is specified.
OX27 'DSR' becomes inactive on the xmt line when the external connec- 'DSR' did not become inactive on the xmt line when the external
tion is broken. connection was unplugged.
Note: Error OX27 will occur only if the nonswitched duplex or switc ed option is specified.
OX28 'DSR' becomes inactive on the rcv line when the external connec- 'DSR' did not become inactive on the rcv line when the external
con-tion is broken. nection was unplugged.
X6F5 XXXX High-speed local attachment oscillator speed test. This manual intervention rtn checks the 14.4KHZ/57.6KHZ high-speed oscillator that is supplied for the High-Speed Local Attachment Line features. The frequency to be checked must be jumpered on the LIB type 1 board in which the oscillator is installed. See the following switch entry specifications for the jumper info. The oscilla-tor frequency is checked to ensure that there is not more than a plus or minus 0.1 percent variation from its expected frequency.
The oscillator frequency and the line that it is to be checked on are entered in the ADDRESS/DATA switches at manual intervention stop code F05S as follows:
Switch BCDE
0 X X X 1404KHZ test on line XXX (jumper on pin side A2G4B07 to A2G4B05) 1 XXX 57.6KHZ test on line XXX (jumper on bin sideA2G4B07 to A2G4B09)
Where XXX is the line adr as defined in the F001 manual intervention stop code.
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3705-80 CSB I FT SYMPTOM INDEX - Cont.
Error Suspected Card Program FEALD FETMM
Routine Code Function Tested Error Description Location(s)
Mask
Page Page CommentsX6F5 XXXX The oscillator frequency is determined by the number of bits shifted in the SDF versus the number of times through a pgm loop. The SDF is set to X'01 FE', and a bit count and pgm loop count are initialized. Each time through the loop, the loop count is decremented by 1, and the low order SDF bit is checked. When the low-order SDF bit is 1, the SDF is reinitialized to X'01FE', and the bit count is decremented by 1. If the loop count is decremented to 0 before the bit count, the residual bit count is compared to 0.1 percent of its initial value. If the bit coiJnt is decremented to 0 before the pgm loop count, the residual pgm loop count is compared to 0.1 percent of its initial value.
This rtn indicates failures if:
1. The frequency selected in ADDRESS/DATA switch B does not agree with the frequency selected by the jumper on A2G4.
2. The oscillator card is defective.
3. 'External oscillator select' bit in the line set fails to set.
4. Oscillator gating cont~ols are defective.
OX01 Set mode to set external clock No L2 irpt occurred. A3L2 TA611 C"()20 Reg X'11' contains the line adr the L2 irpt was
A3T2 TB411 C-160 expected from.
A3T4 TB412
A3U2 TB413
A3U4 TB414
OX02 SDF shifting SDF bit 9 did not set to 1 in the approximate 180 ms wait time. A3L2 TA611 C-020 SDF bits 1, 2, 3, 4, and 5 were set by an output
A2G4 VA070 X'46' with X'01 FO'. Regs X'14' and X'13' contain
the state of the ICW bits 2.0-5.7 at the end of the wait time. Reg X'14' contains the SDF bits 0-7 in byte 1. Reg X'13' contains SDF bits 8 and 9 in 0.0-0.1 and external clock bit in 1.7.
OX03 Oscillator frequency Oscillator under test running too fast. The bit count decremented A3L2 TA611 C"()20 Reg X'14' contains the residual loop count. Reg to 0 before the pgm loop count was decremented below 0.1 percent A2G4 VA070 X'16' contains the initial loop count.
of its initial value.
OX04 Oscillator frequency Oscillator under test running too slowly. The pgm loop count A3L2 TA611 C"()20 Reg X'14' contains the residual bit count. Reg
decremented to 0 before the bit count was decremented below A2G4 VA070 X'16' contains the initial bit count.
0.1 percent of its initial value.
This page intentionally left blank
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3705-80 CSB I FT SYMPTOM INDEX - Cont.
Error'
Routine. Code Function Tested
NOTES:
Error Description
84 lSP8Cted Card
Location(s)
The following notes, which are referred to in either the error code description or the error code comments, provide reg contents and other info for that error code.
Program Mask
FEALD Page
Note 1: The expected char-svc L2 irpt either did not occur, or the char-svc L2 irpt was from the wrong line adr. The contents of the following reg indicate the type of error and the expected data:
Reg X'11'
=
line adr the char-svc L2 irpt was expected from. This line adr in in the format used to set ABAR.Reg X'14' = either the line adr obtained from ABAR of the line that caused the char-svc L2 irpt; or, if reg X'14' = 0000, the expected char-svc L2 irpt did not occur.
Note 2: The expected xmt line char-svc L2 irpt either did not occur, or the char-svc L2 irpt was from the wrong line adr. The char-svc L2 irpt should be from the xmt line adr. The following reg indicate the type of error and the expected data:
Reg X'11'
=
xmt line adr the char-svc L2 irpt was expected from. This line adr in in the format used to set ABAR.Reg X'14'
=
either the line adr obtained from ABAR of the line that caused the char-svc L2 irpt; or, if reg X'14'=
0000, the expected char-svc L2 irpt did not occur.Reg X'13' =' rcv line adr. There should be no rcv line char-svc L2 irpt at this time. Error could be caused by a feedback check setting LCD to F on the xmt line, by the xmt or rcv line selecting the wrong oscillator, by a clock correction failure in the BCC card of the LIB, or by some other line set, LIB, or scanner problem.
Note 3: The expected rcv iine char-svc L2 irpt either did not occur, or the char-svc L2 irpt was from the wrong line adr. The char-svc L2 irpt should be from the rev line adr. The following reg indi-cate the type of error and the expected data:
Reg X'13'
=
rcv line adr the char-svc L2 irpt was expected from. This line adr in in the format used to set ABAR.Reg X'14'
=
either the line adr obtained frqm ABAR of the line that caused the char-svc L2 irpt; or, if reg X'14'=
0000, the expected char-svc L2 irpt did not occur.Reg X'11' = xmt line adr. There should be no xmt line char-svc L2 irpt at this time. Error could be caused by a feedback check setting LCD to F on the rcv line, by the xmt or rev line selecting the wrong oscillator, by a clock correction failure in the BCC card of the LIB, or by some other line set, LIB, or scanner problem.
Note 4: The 'test data' latch and its function in the diag wrap tests is a major tool in problem determination for the type 2 communication scanner internal functional tests. Most of the rtn that xmt and/or rcv data depend on the proper setting of the 'test data' latch in the communication scanner. The test data latch is set to a mark condition when an ICW is scanned and that ICW is for a I
line adr that is in diag mode, has a bit svc pending, and any of the following conditions apply:
a. Xmt state and next bit to be xmt is a 1.
b. A set mode (PCF
=
1) is being done.c. Disable communication scanner (power on reset) is active.
In step a, the next bit to be xmt may be from SDF bit 9, PDF bit 7, or a 1 bit forced by some other conditions, such as xmt initial.
The 'test data' latch may be set to a space condition when an ICW is scanned and that ICW is for a line adr that is in diag, has a bit svc pending, is in xmt state, and the next bit to be xmt is a O. The
o
bit to be xmt may be from SDF bit 9, PDF bit 7, a forced start bit, 0 bit insert, or 0 bit break signal.Line adr in rcv mode strobe data into the rcv data bit buffer from the 'test data' latch if, when the ICW is scanned the line is in diag mo.de, a bit svc is pending, and 'DTR' is not on.
During diag mode transmissions, the transitions between mark and space in the 'test data' latch should follow the bitsvc requests caused by the xmt clock (oscillator). The ICW for the diag xmt line must be scanned before the 'test data' latch can be set or reset, so there may be a delay of up to one full scan period before the 'test data' latch is set or reset after the bit svc request is made. The period differences between the scan cycles and bit svc requests usually result in an average delay of one-half of a scan period between the bit svc and the setting or resetting of the 'test data' latch.
An unstable trace appears on the 'test data' latch during diag xmt operation caused by this delay. This unstable trace also occurs at the send data bit buffers during normal line xmt; unstable trace does not occur on the actual xmt line because the bit to be xmt is not set into the xmt trigger until the next bit svc request time.
There is an average delay of one-half of a scan period between the time When the rcv line bit svc occurs and the rcv data bit is gated into the SDF or PDF of the rcv line's ICW.
The above two delays on the diag xmt and rcv operations normally account for less than one-half of a bit time. This delay usually will have no affect on a diag wrap operation except that the rcv clock correction circuits will be forced into action to correct for the jitter on the 'test data' latch. With the higher speed oscillators, this delay, along with rcv clock correction, may add up to more than half of a bit time. When this delay exceeds half of a bit time, the sequence of xmt and rcv line char-svc L2 irpt may be affected. This sequence of irpt is explained in more detail in notes 5 and 6.
Note 5: The rtn did a diag wrap data using SIS I,.CDs. The rcv line adr is expected to cause its char-svc L2 irpt with a char being rcv before the char is completely xmt on the xmt line adr. This occurs only in diag mode when the 'test data' latch is in use (see note 4). During the manual intervention external data wrap test and during normal line operation, this does not occur because there is an extra bit time delay between the send data bit buffer and the xmt trigger. The rcv irpt occurs before the xmt irpt because the rev line strobes the rcv data bit and requests its char-svc L2 irpt near the middle of the first or only stop bit at the end of the rev data char. The xmt line does not request its char-svc L2 irpt until the end of the last or only stop bit at the end of the char being
FETMM
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