Spin-Polarized
Scanning Tunneling Spectroscopy
Applied to
Ultrathin Fe/W(110) Films
Dissertation
zur Erlangung des Doktorgrades
des Fachbereichs Physik
der Universität Hamburg
vorgelegt von
Oswald Pietzsch
aus Hamburg
Hamburg
Prof.Dr. RolandWiesendanger
Prof.Dr. RobertL.Johnson
Prof. Dr. MichaelFarle
Gutachter derDisputation:
Prof.Dr. RolandWiesendanger
Prof.Dr. HansPeter Oepen
Datumder Disputation:
14.5.2001
Vorsitzender desPromotionsausschusses:
Inhaltsangabe
Die Erforschung immer kleinerer magnetischer Strukturen bis hinab zur
atomaren Skala ist aktuell von groÿem wissenschaftlichen Interesse.
Zu-gleich ist dieser Forschungszweig von höchster technologischer Bedeutung
für die Entwicklung magnetischer Datenspeicher extremer Dichte sowie für
dieErschlieÿung desneuen GebietsderMagneto-Elektronik. Dieinder
vor-liegendenArbeitvorgestelltemagnetischsensitiveMikroskopie-Methode der
spin-polarisiertenRastertunnelspektroskopieisteinneues,äuÿerst
leistungs-fähigesForschungswerkzeug, dessenroutinemäÿiger Einsatzhier zumersten
Malzusammenhängend dargestellt wird. In seinemräumlichen
Auflösungs-vermögenübertritdasVerfahrendiebislangeingesetztenMethoden
höchst-auflösendermagnetischerMikroskopie umzweiGröÿenordnungen.
Nach einer im Kapitel 1 gegebenen allgemeinen Einführung werden die
theoretischenGrundlagenderspin-polarisiertenRastertunnelmikroskopieim
Kapitel 2 dargestellt. Es folgt in Kapitel 3 eine eingehende Beschreibung
des instrumentellen Aufbaus des speziell für magnetische Untersuchungen
konzipierten Rastertunnelmikroskops. An dicken (50 Monolagen) und
dün-nen (7 Monolagen) Gd-Filmen, epitaktisch gewachsen auf W(110), werden
ersteUntersuchungenzurmagnetischenSensitivitätdesMikroskops
durchge-führtundwichtigeErkenntnissehinsichtlichderAnisotropieferromagnetisch
beschichteter Tunnelspitzen gewonnen; dies wird in Kapitel 4 beschrieben.
ZurEinführungindieUntersuchungdesSystemsnano-skaligerEisenstreifen
auf einem gestuftenW(110) Substrat wird in Kapitel 5 ein Überblick über
bereits publizierteErgebnisse gegeben,auf dieimWeiterenaufgebautwird.
Das System von Eisenstreifen wird dann im Kapitel 6 als Modell genutzt,
an dem praxisnah der magnetische Kontrastmechanismus des Mikroskops
erläutert wird. Mit einem auf höchste laterale Auösung optimierten
Ver-fahren wird das magnetische Domänensystem der Eisenstreifen sodann im
Detail untersucht, das durch ein kompliziertes Wechselspiel
widerstreiten-der Anisotropien auf der Nanometer-Skala bestimmt ist. Es wird sowohl
die in der Filmebene liegende Magnetisierung von Fe-Streifen einer Dicke
von lediglich einer atomaren Lage beobachtet, als auch die senkrecht zur
Filmebene stehende Magnetisierung von Streifen, die zwei atomare Lagen
dick sind. Diese Ergebnisse sind im Kapitel 7 dargestellt. Das Kapitel 8
ist Beobachtungen gewidmet, die am System der Eisenstreifen in variablen
magnetischen Feldern erzielt wurden. Es konnte eine vollständige
Hyste-resekurve bestimmt werden; dieder Hysterese zugrunde liegendenProzesse
werden im Detail beobachtet. Damit wird zugleich die wichtige Tatsache
demonstriert,dassspin-polarisierteRastertunnelmikroskopieauchinstarken
Abstract
Theexplorationofmagneticstructuresataneversmallerultimatelyatomic
scale is currently a topic of great scientic interest. It is also of highest
technological relevance in engineering extreme density magnetic data
stor-age devices and developing the new eld of magneto-electronics. In this
presentworkspinpolarizedscanningtunnelingspectroscopy(SP-STS)is
in-troduced asanew, extremelyversatileinvestigation tool. For therst time,
itsapplication onaroutinebasisiscomprehensivelydemonstrated.
Regard-ingspatialresolution, thismethod surpassesother highresolution magnetic
microscopytechniques bytwo orders of magnitude.
After a general introduction given in Chapter 1 the theoretical
founda-tionsofSP-STMwillbepresentedinChapter2. Theinstrumentalsetupofa
scanningtunnelingmicroscope,customdesignedforthepurposeofmagnetic
investigations, is described in Chapter 3. First results in the study of the
microscope's magnetic sensitivity were obtained on thick (50 monolayers)
andthin(7 monolayers) Gdlms grown epitaxiallyonW(110). These
mea-surements also provided important insights into the magnetic anisotropies
oftunnelingtips coatedbyferromagneticthinlms and willbe discussedin
Chapter 4. As an introduction to the investigation of the system of
nano-scale ironwires grownon astepped W(110)substrate anoverviewof
previ-ously published results will be given inChapter 5. Arrays of Fe nanowires
willthenbeusedinChapter6asamodeltodiscussthepracticalapplication
andthemagneticcontrastmechanismofthemicroscope. Optimizedfor
high-estspatialresolution,themethodwillthenbeappliedtoa detailedstudy of
themagnetic domain structure of the Fe stripeswhich are characterized at
the nanometer scale by a complicated interplay of competing anisotropies.
In Chapter 7 observations of stripes of single atomic layer thickness and
stripesoftwo layersthicknessaredescribed,themagnetization beinginthe
lmplane forthe former,and perpendicularto thelm planefor thelatter.
Chapter 8 is dedicated to observations made on the array of Fe stripes in
variable external magnetic elds. A complete hysteresis loop is presented,
acquiredat the nano-scale. Also, detailsof theremagnetization processlike
domainwallmotion,domain creationandannihilation, areobserved. These
resultshighlight theimportantfactthatSP-STS canroutinelybeappliedin
1 Introduction 2
2 Theory of SP-STM 9
2.1 TheTunnel Eect . . . 9
2.2 TheTunneling Process intheSTM . . . 11
2.3 ScanningTunneling Spectroscopy . . . 16
2.4 SpinPolarized ScanningTunneling . . . 19
2.4.1 SpinPolarized Constant Current Imaging . . . 20
2.4.2 SpinPolarized ScanningTunneling Spectroscopy . . . 22
3 Instrumental Setup 25 3.1 The Cryo STM . . . 25
3.1.1 Chamber system . . . 25
3.1.2 MagnetCryostat System. . . 26
3.2 STM Design. . . 28
3.2.1 Approach Mechanism . . . 30
3.2.2 SampleRotation . . . 31
3.2.3 TipExchange Mechanism . . . 33
3.2.4 ElectricalConnections . . . 34 3.3 Performance . . . 34 3.3.1 MicroPositioning. . . 34 3.3.2 AtomicResolution . . . 35 4 Results on Gd(0001)/W(110) 37 4.1 Thick Films . . . 37 4.2 Ultrathin Films . . . 40
4.2.1 Conclusionsand Open Questions . . . 45
5 Fe/W(110) Films: Previous Results 46 5.1 Morphology . . . 46
6 Spin Polarized Imaging 50
6.1 UncoatedTips . . . 50
6.2 MagneticallyCoated Tips . . . 51
6.2.1 SpinResolved Spectraof 1.5MLFe/W(110) . . . 52
6.2.2 TheImpact ofBiasVoltage on theContrasts . . . 54
6.2.3 Accelerated DataAcquisition . . . 57
6.3 TipIssues . . . 58
6.3.1 TipMagnetic Anisotropy . . . 58
6.3.2 Tip-Sample Interaction. . . 59
7 The Domain Structure of Fe Nanowires 61 7.1 Overview . . . 61
7.2 Magnetization inMono-andDouble Layers Fe . . . 63
7.2.1 DomainWalls . . . 68
8 Field Dependent Measurements 72 8.1 TheDevelopment of theDomains . . . 72
8.1.1 Hysteresisat theNano-Scale . . . 76
8.1.2 Mechanismsof Magnetization Reversal . . . 77
8.1.3 ResidualDomains . . . 78
8.2 TipswithIn-Plane Anisotropy . . . 80
8.3 Non-Magnetic Tips . . . 85
8.3.1 DomainProperties . . . 89
8.3.2 Outlook . . . 91
9 Summary 92
Introduction
Thequestforanunderstandingofmagnetismatanatomiclengthscaleisone
ofthecurrentfrontiersincondensedmatterandmaterialsscience. Thanksto
greatadvancesinultrahighvacuum(UHV) technology andmolecular beam
epitaxy(MBE) techniquesduringthe pastdecadeithasbecomepossibleto
study magnetism underthe conditionof reduced dimensionality,such asin
ultrathin lms of magnetic material, in nanowires, clusters, or even single
adatomsonasurface. Magneticmaterialsoftwo,one,orzerodimensions
ex-hibita largenumberof surprisingproperties. Theseareof greatinterestfor
fundamental research. Although considerable experimental and theoretical
progresshasbeenachievedinthelast fewyearsthesubjectmatterismainly
still inthe eldof basic research. Inrecent years themain driving force in
thiseld, however, camefrom appliedphysicsand technology. The demand
for ever higher data storage and processing capacity intensied the
world-wide requestfor nano-techniquesthatpromise to be ableto tailormagnetic
materialsexhibitingwelldenedproperties. Thediscoveryofthegiant
mag-netoresistance eect (GMR) [13] adecade ago hasinitiated a vast amount
of research activities, and it also had an enormous impact on technology
relatedto magnetic data storage. It is a unique situation that, despite the
factthatmanyriddlesstill haveto besolved, thetechnologicalapplications
alreadyhavereachedthemassmarket,theperhapsmostprominentexample
beingIBM's hard diskreadhead which isbasedon theGMReect.
Currently, the data storage industry reports an increase in areal data
densityof60 percent annually. While, for futuresystems,thespin
informa-tionofasingleatomisconceivedthe ultimate physical unitto magnetically
store a bit of information, the next serious obstacle to soon be approached
technologically is the superparamagnetic limit. Decreasing bit sizes lead to
signalenergiesbecomingsosmallastobecomparablewiththeambient
ther-mal energy, resulting in a decay of the stored magnetic signal. The lower
limitforthemagneticgrainsize(whichisequivalenttoaswitchingunit)has
recentlybeenestimatedto 600nm 3
In general,GMRdevices relyonmultilayerstacksof magnetic and
non-magnetic metallic ultrathin lms of nanometer thickness, i. e. on vertical
magnetic nanostructures. The study of laterally structured nanomagnetic
systemsof only one or zero dimensionswas hamperedin thepastbya lack
of an adequate magnetic imaging technique being able to provide a
resolu-tion thatcould holdpacewiththe reductioninsize of theentities thatcan
beproducedinacontrolledfashion(foranoverviewontherelevanceofsuch
structuressee, e. g.,[5]).
InthisworkIwillpresentspinpolarizedscanningtunnelingspectroscopy
(SP-STS)asanew, extremelyversatileimagingtoolfor thestudyofsurface
and thin lmmagnetism. The newmethod combines the well known
capa-bility of a scanning tunneling microscope (STM) to achieve highest spatial
resolution witha sensitivityfor thespin of the tunneling electrons. In this
waySP-STSallows tocorrelate structural,electronic, andmagnetic
proper-ties ofa sampleat an unprecedented spatialresolution.
ToputSP-STS inperspective,ashortreviewofother magneticimaging
methodscurrently inuseisgiveninthe following. The mostwidelyapplied
experimental method in the study ofultrathin ferromagnetic lms is based
on the magneto-optical Kerr eect (MOKE). A beam of polarized light is
directedontothemagneticsample,andtherotationofthepolarizationinthe
reectedlightrevealsthemagneticproperties. Themethodiseasytoemploy,
providesa resonable surfacesensitvity (atapenetration depthof 20 nm)
and is robust in an applied external magnetic eld. The spatial resolution
of MOKE microscopy, however, is ultimately limited to about 300 nm by
the wave length of the probing light. It is clear that the received signal is
an average over the respective surface fraction. MOKE hasbeen employed
in scanning near-eld optical microscopy (SNOM) in order to circumvent
this limitation. A lateral resolution of approx. 50 nm has been obtained
so far [6]. MOKE is the method of choice to measure spatially averaged
hysteresiscurvesof thinlms.
Scanning electron microscopy with polarization analysis(SEMPA)is an
ultra-high resolution magnetic imaging technique. A nely focused beam
of electrons is scanned across the surface, and the spin polarization of the
secondaryelectronsemittedfromthesampleisanalysed. Thelateral
resolu-tion limit dependsonly on the beamwidth; the signal intensities, however,
get extremely small eventually. This method allows to measure all three
magnetization components simultaneously. The surface sensitivity is very
high(1 nm probingdepth), and thelateral resolution is about 20 nmup
to-date[7,8]. Itisaseveredrawbackofthistechnique thatmeasurementsin
strongappliedmagneticeldsare,exceptforveryspecialcases,notpossible.
InLorentzmicroscopyatransmissionelectronmicroscope(TEM)isused
to measure the deection of an electron beam due to the magnetic
leading to a cancellation of the signalin certaingeometries. Several modes
ofapplication areused, e.g. the defocused or Fresnel mode, or the
dieren-tialphasecontrast (DCP)mode,thelatterreachingaresolutionbetterthan
10 nm [9]. A review of the various modes of operation is given in [10] and
referencestherein.
Using photons for probing and also for signal detection has the great
advantage thatlarge external magnetic eldscan be applied to thesample.
ThishasbeendemonstratedatX-raywavelengthsbymagnetictransmission
X-ray microscopy (MTXM) [11]. Themethod relies on theX-raymagnetic
circular dichroism (XMCD) as a contrast mechanism and is unique in that
it provides chemical sensitivity. Absorption rates at element-specic core
levels exhibit adependenceon the projection of themagnetizationonto the
photonpropagation directioninferromagneticsamples. A lateralresolution
of25 nmhasbeen reportedrecently [12].
A new versatile technique for magnetic domain observation has been
developed by a combination of X-ray magnetic linear dichroism (XMLD)
spectroscopyand photoelectron emissionmicroscopy(PEEM) [13]. The
ex-cited secondary electrons give rise to the signal in the PEEM and provide
a spatial resolution of 20 nm. The sampling depth of XMLD-PEEM is
about 2 nm. Recently, ithasbeen shown [14] bya combined application of
thelinearandcirculardichroismeectandanX-raysourcetunableinenergy
thatmeasurementsonbothsidesofaninterfaceconsistingofultrathinlayers
of antiferromagnets and ferromagnets can be carried out opening the door
for abetter understandingof theexchange bias eect whichis ofhigh
tech-nologicalrelevancefor tailoringthe characteristicsofmagnetic propertiesin
magneto-electronic devices.
In magnetic force microscopy (MFM) the external magnetic stray eld
ofthe sampleisprobedbyamagnetictipxed toa exiblecantilever. Two
modesofoperation areinuse. Either themagneticdipolar forceexertedon
thetipbythe samplestrayeldismeasuredviathecantilever deection,or
the force gradient is measured by oscillating the cantilever at its resonance
frequencyanddetecting theshift infrequency dueto thestrayeld
interac-tion. The lateralresolution achieved sofar isabout 2050 nm[15,16]. This
method has reached a considerable degree of industrial applications since,
ifmoderate resolution is sucient, itcan be applied at ambient conditions.
For ahigher resolution ultra-high vacuum(UHV) isrequired.
Pierce [17] expecteda scanningtunneling microscopeto betheultimate
microscopicalmagneticinvestigationtoolifthetipitselfisa source of
spin-polarizedelectrons. Scanningtunnelingmicroscopy(STM)anditsderivative
scanningforcemicroscopy(SFM)aretheonlytechniquesavailableproviding
real space images of surfaces at theultimate, atomic resolution. After rst
reports on spin-polarized vacuum tunnelingbyWiesendanger et al. [1820]
STM (SP-STM) studies are still extremely rare up to-date. This is owed
partlyto certaintechnical diculties(e.g.one needsareliablein situtip
ex-change mechanism inorder to compare measurements taken with normal
tipsto thosetaken withspinpolarizedtips),butthemainproblemisto
un-ambigiouslydiscriminatemagneticallycausedcontrastsfromthosecausedby
otherfeaturesoftheelectronicdensityof statesneartheFermilevel. Apart
fromtheinstrumentalproblemsjustmentioned thequestionofassigningthe
observed contrasts inSP-STM imagesto magneticproperties ofa sampleis
ofa morefundamentalnature. Ingeneral, onlya smallmodication of
con-ventional STM images due to spin polarization was anticipated. Applying
theargumentthatthetunnelingcurrent isdominatedbythedelocalizedbut
only weakly polarized s;p electrons, Himpsel et al. [5] expected an
appre-ciable spin-polarized contribution only at rather short tunneling distances,
i.e.at hightunnelingcurrentswhere localized3d statesofhighpolarization
gain weight. However, the authors already pointed to d-like surface states
identied byStroscio et al. [21] at Fe andCr surfaces using an STMinthe
spectroscopic mode of operation. Indeed, when Bode et al. [22] succeeded
in resolving the magnetic domain structure of thin Gd lms they operated
their SP-STM in the spectroscopic mode, and it was the well-known
spin-split surface state of Gd that gave rise to the magnetic signal. As will be
described theoreticallyinChapter2and furtherillustrated byexperimental
results in Chapters 4-8, SP-STS can directly address such highly polarized
features by selectively evaluating their density of states at a properly
cho-senenergy. Making use ofthe spin valve eectone can measurelocallythe
dierential conductance dI=dU which will be dierent for a parallel or an
antiparallel congurationof the magnetization of tipand sample. By
map-ping the dI=dU signal as a function of the lateral tip position an image of
themagnetic domain structure of the sample can be obtained. In this way
domainimaginghasbecomepossibleatanunprecedentedspatialresolution.
Moreover,sincethetopographyofthesamplecan beimagedinconventional
constantcurrent imagingmodesimultaneouslytothedI=dU mapthe
struc-tural,electronicand magneticproperties ofthesample canbecorrelated at
highprecision. An exampleis displayed in Fig 1.1. There isone important
conclusion thatcan be drawnat rstsight froma comparison ofa constant
current image and a simultaneously recorded dI=dU map: while an eect
of spin polarization is hardlymeasurable in many cases in thetopographic
image, the magneticcontrast is most obvious inthe dI=dU map. This
con-clusionwillbesupportedbynumerousexamplespresentedlaterinthiswork.
In recent years, threedierent experimental concepts have been applied
to achieve spin-polarized vacuum tunneling. (i) Ferromagnetic thin lm
probe tips have been used in the early experiments by Wiesendanger et
(dier-20 nm
Figure1.1: STMimagesof1.5MLFeonasteppedW(110)singlecrystal. (a)T
o-pographicimageacquiredin constantcurrentmode,(b)simultaneouslymeasured
dI=dUmap. Thecontrastsin(b)revealthemagneticdomainstructureofthe
sam-plewhichisinvisiblein(a). Tunnelingparameters: I =300nA,U = 300mV.
gurationsof tip and sampleexploiting the spin valve eect. (ii) GaAshas
been used as sample or as tip material because of its optical polarization
properties. Alvaradoetal. [23]injected spinpolarizedelectrons fromabulk
ferromagnetic tipand measured the circular polarization of the
recombina-tion luminescence. Jansen et al. [24,25] applied GaAs tips as a source of
spinpolarizedelectronsbyopticallypumpingwithcircularly polarizedlight.
(iii)Usinganamorphousmagnetictipmaterial oflowcoercivityin
conjunc-tionwitha smallcoil wound around thetip Wulfhekelet al. [26,27]rapidly
switched the tipmagnetization byapplying ahighfrequency a.c. current to
the coil and measured the dierential magnetic conductance dI=dm
t using
alock-intechnique.
The experimental results reported in this work were achieved following
Bode's approach. While in one of the early spin-resolved experiments tips
made from bulk ferromagnetic material have been used [20], here
conven-tionalnon-magnetictungstentipscarryinganultrathinlmofferromagnetic
materialareappliedmainlyfortheadvantageofamuchlower strayeld
ex-erted by the highly reduced quantity of magnetic material at the tip. In
orderto use such tipsit ismandatory to have facilities available to prepare
tips in situ, i.e. to clean them in UHV from oxide layers, to grow
epitax-ial lms on them in a controlled fashion, and to insert a tip into the STM
withoutbreakingthevacuum. Theserequirementsarefarfrombeingtrivial
tofulll, and therearebut asmall number ofexperimentalsetups available
wordwideifanythatallowforsuch anarrangement. InChapter3Iwill
describe indetail how theseproblems have been resolved.
Thestartingpointfortheexperimentalpartofthisworkwillbein
Chap-ter 4 a presentation of some early results obtained on Gd lms grown on
W(110)intworanges ofthickness. Filmsof 50 monolayers (ML)Gdserved
asa rst test systemfor thegeneral magnetic sensitivityof the new
micro-scope. Next, results from a lm of only 7 ML Gdwill be described. It has
dicularto the sample plane. Although this study remained incomplete due
to certainexperimentalproblems theresults turned out later to be of great
value in a rather unexpected way. It provided the freedom of choice with
regard to themagnetic anisotropy ofthetip, and thisis themain reasonto
presentthe datahere.
The main focus throughout this work will be on the magnetic domain
structure ofthe system of1.5 MLFe grown ona stepped W(110) substrate
whichwillbecoveredinChapters5-8. Thissystem,foranumberofreasons,
provides an excellent model to demonstrate the power of SP-STS. First of
all,acomprehensivecorpsofliteratureisavailable,themajorityofthe
publi-cationsbeingconnectedto theworkofUlrichGradmannandHans-Joachim
Elmers. Thanksto the longterm workof theirgroups thegeneral magnetic
structureofultrathin Felms onW(110)iswell known. A shortreviewwill
be given inChapter 5. It isan important prerequisite for a new method in
order to establish its validity that it is able to reproduce earlier conrmed
results. Albeit,asIwillshowinChapters6-8,thereismuchmoretodiscover
inasystemascomplexasthisone. Asasecondreason,thetypicalmagnetic
domain widths of the Fe lms are below the resolution limit of established
domain imaging techniques but are in a range which is particularly suited
for STMimaging.
The magnetic characteristics of 1.5 ML Fe/W(110) are determined by
an in-plane magnetization for areas covered by just a single atomic layer
of iron whereas areas covered by two atomic layers are magnetized
out-of-plane. Whengrownonavicinal W(110)substrateat elevatedtemperatures,
the iron lm forms a sytem of stripes extending along the tungsten step
edges. From the available literature it is known that the magnetization in
adjacent doublelayer (DL)stripespointsalternatingly upand down dueto
dipolar coupling. It was the main goal of the current study to resolve this
out-of-plane magneticstructure of the DL stripes,and iteventually showed
upasa strongbright-and-dark contrast (cf.Fig1.1(b)). WhileinChapter6
emphasis will be put on the details of the imaging process, Chapter 7 is
dedicatedto a discussionofthe magnetic domain structure ofthe sample.
As an ultimate proof of the magnetic origin of theobserved contrasts I
willpresent imageswhichwereacquiredfromasampleexposedto avariable
externalmagneticeld. Nexttoitsunrivaledspatialresolutionitisa
partic-ularstrengthofthe SP-STStechnique thatitcanbeapplied instrong
mag-netic elds. In Chapter8this featurewill bedemonstrated alonga detailed
study ofthe magnetization reversalin ultrathinmagnetic nanowires. Based
oninformationacquiredatthenano-scale,acompletehysteresisloopcanbe
extracted from SP-STM images. Moreover, the processes behind hysteretic
behavior, i.e. domain wall movement, domain creationand annihilationare
observed indetail.
ex-more closely a previous discovery we repeatedly ran into more unexpected
eects of either the sample or, of equal importance, of the ferromagnetic
tunneling tips. Experimenting with dierent coating materials for the tips
had a dramatic inuence on the obtained magnetic images. A variation of
the magnetic tip anisotropy allowed to observe either domains or domain
walls, and in certain cases of both simultaneously. Surprisingly, even bare
non-magnetictungstentipscanbeusedtoobservemagneticallycaused
phe-nomena. Examples willbepresentedinChapter8.
Can atomic resolution be achieved in spin polarized scanning tunneling
experiments? Yes,itcan. Surprisingly,itistheconventionalconstantcurrent
imagingmodeinconjuntionwithaferromagneticallycoatedtipthathas
pro-videdtherstatomicallyresolvedimagesofanantiferromagneticallyordered
MnmonolayeronW(110),verifyingatenyearsoldtheoreticalpredictionby
Blügelet al. [28]on the existenceof two-dimensional antiferromagnetism in
monolayer lms. In this systemthe magnetic orientation changes from one
atomto itsnext nearestneighbor, andatomic resolutionis aprerequisitein
ordertogainmagneticinformationatallsincethemagneticmomentscancel
atanylargerscale. Itwasmygreatpleasuretotakepartinthisexperiment,
"discovering the grail of magnetic imaging", asStefan Heinze coined it. It
has been described in detail in Ref. [29] and more comprehensively in the
recently published Ph.D. thesis of Heinze [30] whom the brilliant theory is
owed that guided the experiment. On the experimental side, the ground
hadbeen preparedbyanearliercareful studyofthegrowthofultrathin Mn
lms on W(110) by Matthias Bode and co-workers [31]. Once the
prepa-ration of magnetic thin lm tips had been mastered on a routine basis the
actual experiment was performed ina rather straightforward manner. It is
a rare condition that both theoretical and experimental expertise combine
insuch afruitfulwayinone group aswasthecasehere. For areviewofthe
experiment Irefer thereader to theliteraturecited.
Many ofthe results thatwill be presentedinthis workdeservea deeper
theoreticalanalysis. Thistaskought to be tackled fromtwo sides: (i)
Clas-sicalmicromagnetictheory,basedon acontinuumapproach,can beapplied
inorderto describetheoreticallytheexperimentally observeddomain
struc-tures; (ii) ab-initio calculations based on the full-potential linearized
aug-mentedplanewave(FLAPW)methodhaverecentlybeenappliedwithgreat
successto ahost ofmagnetic systems[32]. Thisapproach isvery promising
inthatitaddressesdirectlythespinresolvedelectronicstructureofasample
Theory of Spin Polarized
Scanning Tunneling
Spectroscopy
2.1 The Tunnel Eect
Aconvenientstartingpointforthetheoryofscanningtunnelingspectroscopy
istheeectoftunnelinginonedimensionlikeitisintroducedinvirtuallyall
basic quantum mechanics textbooks. The eect to be described is a result
ofthewave-particle dualism whichis unknownto classical physics.
IfaparticleoftotalenergyE impingesuponapotentialbarrierofheight
V
0
andnitewidthsitwill,accordingtothelawsofclassicalphysics,onlybe
abletopassthebarrierifE isgreaterthanV
0
,otherwiseitwillbereected.
If the particle is of microscopic dimensions as, e.g., an electron, it must be
describedintermsofquantumphysics,andtheresultiscompletelydierent.
Even for the case E < V
0
there is a certainprobability to nd theparticle
behind the barrier, and this phenomenon is known as tunneling. The most
simple situation is a single particle, let's say an electron of kinetic energy
E, incident from the left upon a one-dimensional potential barrier. The
I
II
III
0
s
V(z)
z
E
0
s
y y
*
a)
b)
potential can bewritten asfollows V(z)= 8 > < > : 0 z<0 V 0 0<z<s 0 z>s (2.1)
Theelectronisdescribedbyitswavefunction (z)whichisasolutionofthe
time-independent Schrödinger equation
h 2 2m d 2 dz 2 +V(z) ! (z)=E (z): (2.2)
Herem is theelectron mass, and h isPlanck'sconstant divided by2. We
candistinguishthreeregions(cf. Fig.2.1): regionIleftofthebarrier,z<0,
region II the barrier itself, 0 < z < s, and region III right of the barrier,
z>s. Inthe regionsI and IIIV(z) =0,and theelectron wave function is
thatofa freeparticle,of thegeneral form
(z)=Ae ikz +Be ikz z<0 (z)=Ce ikz +De ikz z>s k= p 2mE h : (2.3)
A;B;C ;andDarearbitraryconstants. Insidethebarrier,thatis0<z<s,
V(z)=V
0
,and the ansatz is
(z)=Fe ik 0 z +Ge ik 0 z 0<z<s k 0 = p 2m(E V0) h : (2.4)
Thetotal energy isnegative inthisregion since E<V
0
,thus k 0
iscomplex,
andtheexponents become real:
2 = k 02 = 2m(V 0 E) h 2 ; (2.5)
therefore the exponentials are real functions describing waves which decay
exponentiallywithin thebarrier.
In region I the general solution of the Schrödinger equation is a linear
combination of a wave traveling to the right and a wave reected at z =0
traveling to the left which combineto a standing wave. At z =0 thewave
function penetrates into the classically forbidden barrier region II where it
is exponentially damped but remains nite at z = s. In region III the
transmittedwave travels to the right, and since no reection occurs we can
determine a rst constant, D = 0. The overall wave function, in terms of
its probability density
, is depicted schematically in Fig. 2.1(b). The
(z)andalsoitsrstderivative d
dz
(z) arerequiredtobecontinuousfor
allz,andbymatching thepartialsolutions found for therespective regions
at the points z = 0 and z = s (wave matching method) we can obtain a
set of four equations that allows to determine the values for theremaining
constants B;C ;E;F in terms of A. This last constant can be chosen to
normalize the wave function. Now we can gain an exact expression for the
transmissioncoecient,whichistheratioofthetransmittedandtheincident
probabilityuxj T and j 0 ,respectively: T = j T j 0 = 1 1+(k 2 + 2 ) 2 =4k 2 2 sinh 2 (s) (2.6)
Inthe limit of s1 this formulareduces to
T 16 k 2 2 (k 2 + 2 ) 2 exp( 2s) (2.7)
When this last expression is a good approximation, T is extremely small.
Themost important result, however,is theexponential dependenceof T on
the width sof the potential barrier. It is this relationship that isexploited
in the scanning tunneling microscope. It is the key to the extremely high
resolution whichallowsfor astudy ofconducting samplesurfaceson ascale
where individualatoms can beresolved.
2.2 The Tunneling Process in the STM
Inan STM measurement a ne metallic tip isapproached asclose asa few
Å (1Å= 10 10
m) to the surface of a conducting sample. The tip is then
scannedlinebylineacrossthesurfacebymeansofappropriatepiezo-electric
elements, and, with a small bias voltage applied, a tunneling current I(U)
can be measured which will, according to Eq. (2.7), vary exponentially as
a function of the distance between tip and sample. This is an example
of metalvacuummetal tunneling. The tunneling barrier between the two
electrodes inthis case isthevacuumgap.
Insidethe metallicelectrodestheelectrons maybe describedinthe
free-electron-gas model. All electronic statesare occupied up to the Fermilevel
(for simplicity, we assume a temperature of 0 K resulting in a sharp edge
in the Fermi function, separating occupied and unoccupied states). The
height V
0
of the insulating vacuum barrier is given bythe work function
of the metallic electrode, i.e.the energy required to extract an electronout
ofthesurfaceinto thevacuum. isamaterial parameter, andforsimplicity
we assume that tipand sample are made fromthe same metal thus having
thesame workfunction. Thewidthofthebarrierisgivenbythetipsample
Tip
Sample
+
-z=0
z s
=
eU
bias
f
s
E
F
E
Vac
f
t
Figure 2.2: Schematics of thetunneling process in theSTM.The barrierheight
is given by thework function of the electrodes, the barrier width correspondsto
thetipsampledistance. AnappliedbiasvoltageU
bias
shiftstheFermilevelsoftip
andsamplerelativetoeachother. Electronscan tunnelfromthenegativelybiased
sample to the tip. A change of bias polarity reverses thecurrent direction. The
sketchindicatesthedecayofasamplewavefunction inthebarrierregion.
to the tip, and the net tunneling current is zero. If we apply a small bias
voltage U
bias
between tipand sample theFermi levelsof theelectrodeswill
shiftaccordingly withrespectto each other (cf.Fig. 2.2). Now a tunneling
current can ow. Throughout this work we will use the convention that
the tip potential always is held grounded. Thus, for positive sample bias
electronswilltunnelfromoccupiedstatesofthetipintounoccupiedstatesof
the sample, and for negative sample bias theelectrons come from occupied
sample states and go to unoccupied tip states. Thus the direction of the
current dependson the polarity ofthe applied bias voltage U
bias .
Ifwe considerthe limitof smallbiasvoltage,i.e. eU
bias
,theenergy
of the tunneling electrons is approximately equal to the Fermi energy E
F .
Insidethe barrierthe wave function of anelectron decays:
(z)= (0)exp( z); = q
2m=h 2
; (2.8)
withtheso-calleddecayconstant. Wecandeterminetheprobabilitydensity
wofndinganelectronatthetippositionsbytakingthesquareofthewave
function: w=j (s)j 2 =j (0)j 2 exp( 2s); (2.9)
For a typical metal we may assume 4 eV. This results in a decay
constant 1 Å 1
increasedby1Å.Thesenumbers illustratethe enormous verticalresolution
thatcanbeachievedbytheSTM.Thisfeatureallowstodetectchangesinthe
tip-sample distanceofthe order of 0:01Å or less. Further, we canconclude
fromEq. (2.8) the important factthatthetunneling current will be carried
almostexclusivelybytheoutermostatomatthetipapexwhilecontributions
from atoms of the next atomic layer within the tip crystallite can in most
cases be neglected. Therefore, the tunneling process in an STM is highly
localized in the sense that it occurs between one atom at the tip and the
samplespot rightbelowit. Thus,whenscannedacrossasamplesurface,the
tipprobeslocalpropertiesofthesamplewithalateralandverticalresolution
thatallows,ingeneral, to resolve individualatoms.
Until now, we have considered tunneling only in the picture of a
one-dimensionalmodel. Thismodelwassucienttointroduce somebasic
mech-anismsthatallowanunderstandingofthe tunnelingprocessingeneral. But
already the term "local", introduced inthe last paragraph, requiresan
ex-planation that can not be given based on this simple model. Furthermore,
wedidnotdiscussthe propertiesoftheprobingtipatall. Itwasintroduced
justasaconductingelectrodebeinglocatedadistancesawayfromthe
sam-ple surface. In most cases, our major concern will be the properties of the
sample, and only insecond place we want to know thetip. In an STM
ex-periment,the ideal of anon-intrusive measurement would be a point probe
withan arbitrarilylocalized wave function [33]. A realistic tip, however, is
made from a certain material having its atoms at the apex arranged in a
particular way, i.e. it has a certain geometry in space and a more or less
extendedwave functionwhich willbedierentfrom thatofa freeatombut
alsofrom thatofa solid. Inother words, the tiphasanelectronic structure
thathasto beaccounted forina 3-dimensional approach.
In1961,twentyyearsbeforetheinventionoftheSTMbyBinnig,Rohrer
and co-workers [34], in his investigation of the tunneling process between
two planar electrodes separated by an oxide layer, Bardeen [35] developed
anexpression forthe tunnelingcurrent,basedupontime-dependent
pertur-bation theory, that has since been used as a fundament to many fruitful
approaches towards a theoryof the tunneling process in the STM. Here, it
is presented inthe formulation of Terso and Hamann [33,36], adoptedfor
a systemof tip and sample separated by a vacuum barrier, and the limits
of small bias voltage and low temperature are assumed. In this model the
tunnelingcurrent isgiven by
I = 2 h e 2 U X jM j 2 Æ(E E F )Æ(E E F ); (2.10)
withethe electroncharge, and theindices and refer to thetipand the
d
R
r
0
Figure 2.3: Modeltip asintroducedby
Tersoand Hamann [33]. Thetip shape
isarbitrarybutsphericalatitslowerend.
R is the radius of curvature, the center
of curvature at ~r
0
. Distance of nearest
approachto the sample surface(shaded)
isd.
problemisthe calculationofthe tunnelingmatrix elementM
of the
tran-sition between states
of the sample before tunneling and
of the tip
after tunneling, and E
(E
) is the energy of state
(
) in theabsence
oftunneling. According toBardeen, thematrix element isgiven by
M = h 2 2m Z d ~ S( ~ r ~ r ): (2.11)
Theintegrationhastobecarriedoutoverasurfacewhichislocatedentirely
withinthebarrier. Inordertocalculatethematrixelementtheenergylevels
andwave functionsofboth tipand sampleneed tobeknown. Thisrequires
a knowledge of their respective atomic structure. While, in general, this
information will be (or can be made) available for the surface, it is almost
impossible to know the details of the microscopic atomic structure of the
tipsince a tip is prepared in a relatively uncontrolled and nonreproducible
manner. 1
However,somesimplifyingassumptionshavebeenintroducedthat
allowedtosuccessfullyinterpretSTMimagesqualitativelyinawiderangeof
applications. Terso and Hamann proposed a model tip of arbitraryshape
butwithalowerend beingaspherical potential well witharadiusof
curva-tureR , thecenter of curvature located at a position~r
0
, thespherical tipa
distanced above the samplesurface, cf.Fig.2.3. 2
In the Terso-Hamann model, the simplest possible wave function for
this tip is assumed, a spherical s-wave function while wave functions with
an angular dependence (l 6=0) areneglected. Nowthe matrix element can
1
Oneway to obtaininformation onthetip's atomicstructureiseld ion microscopy
(FIM).However,aspontaneousrearrangementofthetipapexatomsisnotunusualduring
scanning, showing up as achange inimaging quality, leaving the experimentatoragain
withatipofunknownatomicstructure.
2
Werecallthatthetunnelingcurrentiscarriedalmostexclusivelybytheonetipatom
closest to the sample surface. This might intuitively suggest a spherical tip apex. In
theTerso-Hamannmodelthis caseis consideredthe limitofsmallestpossible radiusof
be evaluated andthus thetunneling current which isthenproportional to I /Un t exp(2R ) X j (~r 0 )j 2 Æ(E E F ); (2.12)
whereU isthe appliedvoltage,n
t
istheconstantdensityofstatesofthetip
at theFermilevel. The quantity
n s (~r 0 ;E F )= X j (~r 0 )j 2 Æ(E E F ): (2.13)
is the local density of states (LDOS) of the surface at the Fermi level E
F ,
evaluatedat thecenterofcurvature~r
0
ofthe eectivetip. Thesamplewave
functionsdecayexponentiallyinto the vacuum(the zdirection isnormalto
thesurface): j (~r 0 )j 2 /exp( 2s); (2.14)
andthetipsampledistanceisdened bys=d+R . Furthermore,boththe
verticalandthelateralresolutionoftheSTMcanbeshowntobedetermined
bya characteristic length L=[(d+R )=] 1=2
[33,36,37].
The Terso-Hamann modelleads to some remarkable results. Themost
important is thatthe tunnelingcurrent is determined bysample properties
alonewhiletheroleofthetipisreducedsimplytothatofaprobe. Themost
widelyapplied mode of STMoperation makesdirect useof this remarkable
feature. In the constant current mode a feedback loop regulates the
tip-sample distance z = z
0
+z as to keep the tunneling current at a chosen
set-point valuewhile the tip isscanned across the samplesurface. The
val-ues of the corrugation z(x;y) can be plotted as a function of the lateral
tip position (x;y). Constant-current STM images now can be interpreted
as contour maps of constant sample LDOS, and to a rst approximation
these constant LDOS contours followthe topographyof thesamplesurface.
In this way the details of the surface geometry like step edges, islands,
de-fects, surface reconstructions etc. can be made visible. After its invention
the STM was most widely applied in the study of structural properties of
surfaces. This new microscopy technique allowed to addressquestions that
werepreviouslynot accessiblebyothersurface sensitive methods whichrely
onthe reectionof electromagneticor matterwaves atperiodicstructures.
However,thesimpleinterpretationoftheconstantcurrentdataasa
topo-graphicimageofthesamplehastobeusedwithsomecare. Thisisespecially
true when the level of atomic resolution isbeing approached. At this level
the TersoHaman model is still able to reproduce the lattice periodicity
ofclose-packed metalsurfaces butfailsto reproduce theexperimentally
ob-servedcorrugationamplitudesifrealistictipradiiandtunnelingdistancesare
assumed. Thisdeciency of the TersoHamann model iswell understood;
cor-d
z
2 symmetry. Chen's model also nicely tsanother observation frequently
made inatomic resolution experiments: during a scan at low tunneling
re-sistance often a sudden drastic enhancement of the observed contrast can
be noticed which, using Chen's picture, can be understood intuitively as a
switching froman s-orbitalto a d-orbitalat thetip.
But also at a length scale greater than the surface lattice constant the
topographicinterpretationofconstantcurrentimagesrequiressomecaution.
DuetothelocalcharacteroftheprobetheSTMissensitivetolocalvariations
intheelectronicstructureofthesamplethatmayarisee.g.fromthepresence
ofadsorbates,alloying,or,inthecaseof ultrathinlms, fromdierent local
coverages. Not in all cases these variations can be interpreted simply as a
variation in height of the sample as is suggested by the constant current
images. Dierent chemical species at a surface will exhibit dierent work
functions. Certain adsorbates on top of a surface may even appear not
as protrusions but as depressions giving rise to anticorrugation. This can
oftenbe observed for oxygen adatomson metal surfaces. Any alteration of
the localelectronic structure will more or less modify the constant current
image. Whatappearsasafurthercomplication atrstsight,however, turns
out as an opportunity to gain access to highly valuable information about
the surface under study. It is the local electronic structure rather than the
mere topography that is addressed by the scanning tunneling spectroscopy
modeofSTMoperation,and aswewillseelater, thismode playsakeyrole
inthe processof magneticimaging.
2.3 Scanning Tunneling Spectroscopy
Eq.(2.12) was derivedinthe limit of small biasvoltage It canbe written
I(~r 0 ;U)/eU s (~r 0 ;E F ): (2.15)
Inthe rangeofafewmillivolts thetunnelingcurrent islinearlyproportional
to the applied voltage U. For higher voltages, this is no longer true. The
Ohmicbehaviorisreplacedbya moreor lesscomplicated non-linear
depen-dence I = I(U). This is the result of the particularities in the electronic
structure of the sample surface, the details of which can be studied locally
by scanning tunneling spectroscopy. As will be shown next, curves of the
dierential conductance dI=dU versus U reveal theLDOS structure within
theprobedenergy range E
F eU.
In general, the eect of a nite bias voltage will be a distortion of the
wave functionsofboth tipand sample, and also theenergy eigenvalues will
be modied, which is dicult to account for. Therefore, the undistorted
zero-voltage wave functionsand eigenvalues are usually taken asa rst
amountofjeUj,andanystructureintheLDOSwillbeincludedintheshift.
In this approximation the result of Terso and Hamann is modied to the
energy integral I / Z eU 0 n t (eU ")n s (")T(";eU)d"; (2.16) where n t and n s
arethe densities of states of tip and sample, respectively,
and all energies are taken with respect to E
F
. Here, the energy and bias
voltage dependence of the transmission coecient T enters to account for
thefactthatthedecaylength dependsonthese parameters. T isgiven by
T(";eU)=exp ( 2s 2m h 2 t + s 2 + eU 2 " 1=2 ) : (2.17)
Since, however, the increase of T with increasing biasis smooth and
mono-tonic itappears asa backgroundon which the LDOS structureinformation
issuperimposed [18].
If we assume n
t
= const: we yield from dierentiating Eq. 2.16 with
respect to U: dI dU (U)/n t (0)n s (eU)T(eU)+ Z eU 0 n t (eU")n s (") dT(";eU) dU d": (2.18)
Thesecondterm describesthebackgroundvariationdue tothebiasvoltage
dependence of the transmission coecient, and the bias voltage dependent
LDOS structure can be attributed to the rst term. The dierential
con-ductance dI=dU(U) is the central quantity we are interested in when we
perform an STS experiment. The details of the LDOS can be probed at
highspatialresolution byvaryingthebiasvoltage. By choosing axedtip
sample separation and ramping thevoltage between, e.g., +1 V and 1 V
and measuring the dI=dU(U)signal asa functionof biasvoltage we obtain
a spectrum ofthe LDOSinthe energy interval. An example isdisplayed in
Fig.2.4, revealing thecharacteristics intheelectronic structureof ultrathin
Fe lms at threedierent coverages on a W(110)substrate.
There is, however, another eect related to the transmission coecient
thathastobetakenintoaccountwhichdependsonthepolarityoftheapplied
biasvoltage. Thiseect isillustrated inFig.2.5. When farawayfrom each
other, the Fermi levels of tip and sample are independent. When brought
into tunnelingcontactthey will acquirean equilibrium,i.e. theFermilevels
of tip and sample will eventually be equal. A bias voltage shiftsthe Fermi
levels with respect to each other. At positive sample bias, tunneling will
occurfromoccupiedtipstatesintoemptysamplestates(Fig.2.5a),whileat
negative samplebias the uxis fromoccupied samplestatesinto emptytip
Figure 2.4: Tunneling spectra
takenatsamplelocations
exhibit-ing three dierent coverages of
Fe/W(110) revealing maxima in
the dierential conductance at
energiescharacteristicforthe
re-spectivecoverageregimes[40].
current, since these electrons "feel" a lower tunneling barrier height than
electrons from states lyinglower in energy. This is indicated inFig. 2.5by
arrowsofdierentsize. Thiseectintroducesanasymmetryinthe
measure-ment process when the polarity of the bias is changed: If, for example, we
areinterested in two features of the sample LDOS,one beingenergetically
locatedat,say,+800mV(unoccupied samplestates)andtheotherat 800
mV(occupied samplestates)withrespectto thesampleFermilevel, wecan
easily probe thefeature having positive binding energy,since the tunneling
process into the region of interest (RoI) is most eective at this bias. In
order to probe the other feature we have to switch the bias polarity. Our
region of interestnowlies inan energetic range where tunneling is least
ef-cient; instead, the spectralcharacteristics will be increasinglymoulded by
contributions whicharedueto emptytip states,andtheassumptionof atip
withan contourless electronic structure becomes increasingly questionable.
Butstillthecondition holdsthatthetip electronicstructurewill stay
unal-teredduring a measurement while the sampleLDOS featureswill varyasa
functionoflateralposition(x;y),thusallowinginmostcasestoseparatetip
eectsinthespectraasaconstantbackground againstthespatialvariations
ofsampleLDOS properties.
Ingeneral,thereareanumberofexperimentalproceduresthatcanbe
ap-pliedfor aspectroscopicmeasurement. Theprocedure usedthroughoutthis
workisthefollowing: Simultaneously totherecordingof aconstantcurrent
image a measurement of the local conductance I(U) and thelocal
dieren-tial conductance dI=dU is carriedout. At every pixelthe value z(x;y) is
measured, providing the data base for the constant current topography of
RoI
RoI
a)
b)
E
F
E
vac
Figure 2.5: Schematicsof thepolarityeect of thetransmissioncoecient. The
regionof interest(RoI) isindicated byashadedrectangle. a)Atpositivesample
bias,unoccupiedstatesofthesampleareeectivelyprobed. b)Atnegativesample
bias,occupiedsamplestatestakepartintunneling. Theregionofinterest,however,
is now in adisadvantageousenergetic range. Instead, unoccupied tip statesgain
weight(afterHamers[41]).
tunneling resistance U=I). Typical stabilization values used during the
ex-perimentsareU =1 VandI =300pA.Thefeedbackloopisthen switched
o,and the voltageis ramped from, e.g. +1 Vto 1 Vwhile thetunneling
current I =I(U) ismeasured. Fromthis curve the dierential conductance
dI=dU can, in principle, be obtained by numerical dierentiation. Since
around U =0V the current becomes extremely small, the signal-to-noise
ratio will be unsatisfactory. Thisproblem canbe circumventedbyapplying
alock-intechnique: whilerampingthe d.c.voltagea smalla.c. signal(30
mV,f
mod
1:8kHz)isadded,andthein-phasecurrentmodulations,i.e.the
dI=dU signal, are detected by a lock-inamplier. Signal variations due to
noiseareeectivelylteredsincetheydonotfollowtheconstantmodulation
frequencyandphase. ThedI=dU versusU curvethenprovidesaspectrumof
theLDOS.Sincethismeasurementiscarriedoutateverypixelthecomplete
setofdataprovidesastackofspectroscopiclayersdI=dU(U;x;y). The
spa-tial distribution ofa spectroscopicfeature of interest, for example asurface
state peak characteristic for acertaincoverage ofa depositedthinlm,can
be plottedasamapofthedierential conductance attheenergeticposition
ofthis particular feature. Thismapcan be compared to thesimultaneously
acquired topography, and structural and electronic properties can thus be
correlated.
2.4 Spin Polarized Scanning Tunneling
ferro-with majority spin (") and the other with minority spin (#). 3
Due to the
magneticexchangesplittingE
ex
theminorityspinbandislledlessthanthe
majority spin band. This imbalance, giving rise to the magnetic moment,
showsup asaspin splitdensityof statesat theFermilevel. If theSTMtip
canbe madesensitive tothe spinof the tunnelingelectrons it shouldbean
ideal toolfor the investigationof magnetismat ultimate spatial resolution.
One way to obtain a spin sensitive tip is to coat a regular tip with a thin
lmof a ferromagneticmaterial, e.g. Fe or Gd. Inthis casethetip exhibits
a spin split band structure itself, and the interplay of the band structures
shouldaectthe tunnelingprobabilitiesofelectronsasafunctionofthespin
orientation.
2.4.1 Spin Polarized Constant Current Imaging
Inhisrecenttheoreticaltreatmentofspinpolarizedscanningtunneling
Hein-ze [30] generalized the Terso-Hamann model to the case of spin polarized
tunneling. The DOS for both spin directions of the tip is assumed to be
constant but of unequal value: n " t =const., n # t = const.,but n " t 6=n # t . This allowstodenen t =n # t +n " t andm t =n # t n " t
forthetip. Similarquantities
canbedenedforthesample,butagaintheydependonthetippositionand
thebiasvoltage:
~ n s (~r 0 ;U)=n~ " s (~r 0 ;U)+n~ # s (~r 0 ;U) (2.19) and ~ m s (~r 0 ;U)=n~ " s (~r 0 ;U) n~ # s (~r 0 ;U); (2.20) where n~ s (~r 0
;U) is calledthe integrated local density of statesof thesample,
and m~
s (~r
0
;U) its integrated local spin density of states. In terms of these
quantities thetunnelingcurrent canbe expressedasfollows:
I(~r 0 ;U;(~r 0 ))/ n t ~ n s (~r 0 ;U) | {z }
non spinpol arized +m t ~ m s (~r 0 ;U)cos(~r 0 ) | {z } spinpol arized : (2.21)
Therighthandsidenowcontainsthesumoftwoterms,acontributionwhich
is not spin polarized, I
0
, and a contribution which depends on the relative
spin orientation of tip and sample, I
P
, and, in order to obtain a magnetic
contrast, it is desired to maximize I
P
over I
0
. Since, in general, tip and
samplewillnot sharethe samemagnetization axis,thecosineoftheangle
between themagnetizationdirectionsoftipandsampleenters. Whereasthe
magnetization direction ofthe tip ~
M
t
can be assumedx inmost cases the
samplemagnetization ~ M s (~r 0
;U) may change as a function of position, and
accordinglytheanglebetween them isafunction of thelateraltipposition,
3
Theargument isnotrestrictedtoferromagnetsbutholdsfor anymagneticmaterial
=(x;y). Thisallows toinvestigate themagneticdomain structureofthe
sampleviathe variationofthespindependentpartofthetunnelingcurrent.
It isobvious thatthe spinpolarized contribution ismaximal for a collinear
conguration ~ M t k ~ M s
, i.e. = 0 for theparallel case ("") or = for the
antiparallel case ("#), while it vanishes for ~ M t ? ~ M s , i.e. = =2. For a
collinear oraperpendicularcongurationthetotal tunnelingcurrent canbe
conveniently given intermsof thecontributing spin channels:
I(~r 0 ;0) = I "" (~r 0 )+I ## (~r 0 )=I p (~r 0 ) (2.22) I(~r 0 ;) = I "# (~r 0 )+I #" (~r 0 )=I ap (~r 0 ) (2.23) I(~r 0 ;=2) = 1=2[I "" (~r 0 )+I ## (~r 0 )+I #" (~r 0 )+I "# (~r 0 )] = 1=2[I p (~r 0 )+I ap (~r 0 )]: (2.24)
The decomposition of the density of states into a spin averaged and a spin
polarizedpart,Eq.(2.21),allowstodenethepolarizationoftipandsample
intermsof thesequantities:
P t = m t =n t (2.25) ~ P s (~r 0 ;U) = m~ s (~r 0 ;U)=~n s (~r 0 ;U); (2.26)
and the polarization of the entire tunneling junction consisting of sample,
vacuum gap, and tip, is given by the product of the polarizations of both
electrodes: P ts =P t ~ P s (z;~r k ;U): (2.27)
Note that the sample polarization depends also on z since the decay rates
for s,p and d electronsmaydier.
Inconstantcurrentimaging,twoeectshavetobeconsidredthatleadto
a degradation of magnetic contrasts. First of all, the non-polarized part of
the tunneling current I
0
increases monotoneously withincreasing bias
volt-agewhilethepolarizedpartI
P
maystayconstant;thustheconstantcurrent
imagewill inmost casesbedominatedbyI
0
[42]. Second,thesample
polar-ization ~
P
s
isan energy integrated quantity evaluated in theenergy interval
selected by the chosen bias voltage. As a consequence, the polarization ~
P
s
may be degraded by an inclusion of states exhibiting a polarization of
op-posite sign. This eect is schematically illustrated in Fig. 2.6(a-d) along a
ctitious spinsplitdensityof states. (b) and(c)represent n~
s
and m~
s as
de-nedinEqs. (2.19)and(2.20),respectively,and(d)symbolizestheresulting
polarization ~
P
s
whichrepeatedlychangessigninthe intervalE
F
eU. This
may even lead to a complete cancellation of the spin polarized part of the
tunneling current, thus preventing the extractionof any magnetic
informa-tion from the sample. Dueto the described problems theconstant current
n
n
n +n
n -n
Polarization [%]
E
ex
a)
E
b)
c)
d)
E
F
100
-100
n(E)
eU
Figure 2.6: (a) Schematic illustration of the spin split density of states at the
Fermilevel. MajorityandminorityspinstatesareshiftedbyanamonutE
ex . (b) Total DOS n " +n #
. (c) Dierenceof majorityand minorityDOS, n "
n #
. (d)
PolarizationP(U)asafunction ofbias.
by numerous examples throughout the remainder of this work, a method
derived fromaspectroscopic approach ismore appropriate forthis task.
However, constant current magnetic imaging has recently been applied
withgreat successto magnetic imagingat theultimate,atomiclength scale
by resolvingfor the rst time the 2-dimensional nearest-neighbor
antiferro-magnetic order of a single monatomic layer of Mn grown on W(110) [30].
Such asystemofchemically identicalbut magneticallyinequvalent atoms is
particularly challenging since the total magnetization is zero and the
mag-neticinformation can befound exclusively at theatomiclength scale. Thus
atomic resolution and magnetic sensitivityis required simultaneously. The
contrast mechanism in this case relies on the fact that the 2-dimensional
translational symmetry of the magnetic superstructure is lower than that
of the chemical surface unit cell which leads to a strong enhancement of
the spin polarized contribution to the tunneling current [30,42]. Constant
currentimaginghasagreatpotentialinthestudyofperiodicmagnetic
struc-turesat theultimate length scale.
2.4.2 Spin Polarized Scanning Tunneling Spectroscopy
For high contrast studies of magnetic domain structures it is necessary to
know the energetic ranges of high polarization within the density of states
structure. This knowledge can be obtained by applying the spectroscopic
modeofthe STM.DierentiatingEq. (2.21) yieldsthespinpolarized
dier-ential conductance, dI(U) dU /n t n s (~r 0 ;E F +eU)+m t m s (~r 0 ;E F +eU)cos(~r 0 ): (2.28)
E Tip
E
E
ex
Sample
n
n
E
F
eU
E
E
n
n
E
F
eU
D
U
mod
a
b
Figure 2.7: Probingthespin split densityof states. (a)Constant current
mea-surement. Allstatesintheinterval[E
F ;E
F
+eU]contributetothesignal,indicated
bythe gray-shadedarea. Polarizationeects maybedegraded oreven cancelled.
(b)Spectroscopicmeasurement. ThedI/dU-signal isacquiredat E=eU as
indi-catedbythenarrowgray-shadedarea. Theenergyresolutionisdeterminedbythe
amplitudeofthea.c. modulationvoltageU
mod
ofthelock-inamplier.
quantities n~
s
and m~
s
whichare central to the constant current mode, while
in the latter the dierential conductance is directly proportional to n
s and m s at an energy E F
+eU. Inconstant current imaging thenon-spin
polar-ized contribution I
0
increases with U while the spin polarized contribution
I
P
maystayconstant. Ontheotherhand,inadI=dU measurementthe
volt-age canbeadjusted asto maximizethe spin polarized contribution m
s over
thespin averaged contribution n
s
. The energetical positions of such ranges
of highpolarizationcan be extracted fromspectral curves measuredon
op-positely magnetized sample locations. Thus, the spectroscopic approach is
particularly suited to image the magnetic domain structure of a sample by
selectively probingfeaturesoftheLDOS exhibitingahighspinpolarization.
AschematicillustrationofthetwomodesofSP-STMapplicationisgivenin
Fig.2.7.
MakinguseofEqs.(2.25)and(2.26)wecanrewriteEq.(2.28)asfollows:
dI(U) dU /n t (U)n s (~r 0 ;E F +eU)[1+cos(~r 0 )P t (E F +eU)P s (~r 0 ;E F +eU)]: (2.29) The tilde of P s
has been dropped since this quantity is no longer energy
integrated. We have reintroduced the bias dependence of the tip related
quantities n
t
(U) and P
t
(U) to account for the fact that in a spectroscopic
measurementthelimitofsmallbiasvoltagewill,inmostcases,notbegiven.
Recallingthe discussionofthe polarityeecton thetransmissioncoecient
onp.17wecanexpectthatanystructureofthetipDOSwillbeparticularly
noticeableinthenegativesamplebiasrange. ForaferromagnetictipitsDOS
structuremayinclude highlypolarizedfeaturesthatshowupat certainbias
voltages. Sincethecontrastrequiredtostudythemagneticdomainstructure
ofasampledependsonthetotalpolarizationofthetunnelingjunctionwhich
An extrapolation of a value for the sample polarization is, however, not
Instrumental Setup
We have endeavored in designing an STM which is extremely stable and
which meetsthreeoperational conditions: ultra-high vacuum, low
tempera-tures, and highmagnetic elds [43]. For the purposeof our special interest
ininvestigationsinsurfacemagnetismwehavesuppliedtheinstrumentwith
some unique features, like sample rotation, easy tip exchange mechanism,
and an arrangement for MOKE measurements. In this chapter I will
de-scribe the instrument indetail.
3.1 The Cryo STM
3.1.1 Chamber system
The new cryomagnet-STM chamber is added to a four-chamber UHV
sys-tem[44]consistingofacentraldistributionchamber,apreparationchamber
equipped with resistive and electron beam heating and a sputter gun, an
MBE chamber with ve evaporators and a home built STM especially
de-signedfor timeresolved growthstudiesdescribed elsewhere[49],ananalysis
chamber containing facilities for standard surface characterization as, e.g.
lowenergy electron diraction(LEED),Augerelectronspectroscopy(AES)
andspin-resolvedphotoelectronspectroscopy(SP-PES),and,withinan
addi-tionalsatellitechamber,acommercialvariable-temperatureSTM[45]which
canbeoperated ina temperature rangeof 30K<T <1000K. Aloadlock
allowsforfastintroduction ofsamplesandtipswithoutventingthechamber
system. To prevent from acoustical and low frequency building vibrations
the whole system is installed in an acoustically shielded laboratory with a
foundation being completely separated from the rest of the building. The
UHV chamber system is supported by a table with additional pneumatic
3.1.2 Magnet Cryostat System
Magnet
The magnet cryostat system(Fig. 3.1) is a modied Spectromag 4
He bath
cryostatwithaLN
2
radiationshield[46]. The2.5Tsuperconductingmagnet
isasplitcoil typewitha62 mmbore. Homogeneityoftheeldina10mm
diametersphericalvolumeatthesamplelocationisspeciedto1partin10 2
.
Themaximumsweep rate accountsto 2.5Tperminute. The central region
of the magnet (cf. Fig. 3.2) has two cutaways of 80 Æ
and 90 Æ
, respectively,
and a minimum height of 42 mm thus providing two access openings to
the microscope. Samples and tips are being exchanged through the 80 Æ
window whereas the 90 Æ
window is usedto carryout magneto-optical Kerr
eect (MOKE) measurements, and to allow for metal or molecular beam
evaporation onto the sample surface. To obtain proper UHV conditions
the magnet is designed to safely endure bakeoutat 120 Æ
C. In our bakeout
procedure we keep the magnet at 115 Æ
C for 48 h. The temperature is
measured by a platinum resistor sensor on top of the magnet. The signal
of this sensorfeeds a control unit that supplies a ow of cold nitrogen gas
acrossthemagnet ifthetemperatureisabouttosurpassthesetpointvalue.
Thus asafe bakeoutoperation isguaranteed overnight.
Cryostat and UHV Chamber
Theheliumreservoirofthecryostathasausefulcapacityof20lgivingahold
timeinthelowtemperature regimeofapprox.40hbetweensubsequent lls.
The helium reservoir and the magnet are enclosed by a nitrogen radiation
shield. Its20lvolumeprovidesa holdtimeof36 h. At thelowerendwhere
the magnet has its above mentioned openings the shield has an additional
rotating cylinder thepurpose of which is to shut the accesswindows. This
cylinder isthermally coupled to themain partofthe shieldby anumberof
copperbraids. Toavoidvibrationsduetoboilingnitrogen theLN
2
reservoir
ispumped to apressure p<5mbar sothat thenitrogen solidies. To cope
withthe initiallyhugeamount ofgasfromtheboilingliquid weusearotary
vane pump witha nominal pumping speed of 65 m 3
/h. Whenthe nitrogen
has solidied at a temperature of 63 K the rate of exhaust gas is greatly
reduced so that a much smaller pump can be used to hold the pressure.
Thispumpislocatedinanadjacentroomwhichisacousticallyisolatedfrom
the STM laboratory. As thegas ow through thepumping line isvery low
we have no acoustic coupling of the pump. Having a radiation shield at a
temperature aslowas63 Kisof considerableadvantage for minimizing the
heliumboil o.
The outer vacuumchamber of the cryostat unit has a DN350 CF base
Table
Preamp
Titanium
Sublimation
Pump
Titanium
Sublimation
Pump
A
B
UHV Chamber
UHV Chamber
LN Radiation
Shield
2
LN Radiation
Shield
2
LHe Bath
Cryostat
LHe Bath
Cryostat
STM
Magnet Coils
Magnet Coils
Thermal Anchoring
of Electrical Leads
Thermal Anchoring
of Electrical Leads
Viewport
Getter Pump
Getter Pump
Evaporator
Manipulator
Figure 3.1: (a) Schematic drawing of thecryomagnetSTM system (sideview).
TheSTM is insertedfrom the bottom through thebase ange which alsocarries
Cut A - B
Cut A - B
Distribution Chamber
Distribution Chamber
Viewport
Manipulator
Evaporator
Viewports for
MOKE
Viewports for
MOKE
Magnet
Transfer Rod
Transfer Rod
Table
Spare Port
Spare Port
90°
80°
Rotating Ratiation Shield
Rotating Ratiation Shield
Load Lock Port
Load Lock Port
STM with Sample
STM with Sample
Figure3.2: Sectionofthecryomagnetsystematthesampleplane.
titaniumsublimation pump. The basepressureafter bakeoutand cooldown
is < 510 11
mbar. The turn-around time for venting the system from
low temperature, bake-out, and returning to low temperature accounts to
several days. Thus it is essential that samples and tips can be introduced
through the load-lockof the central distribution chamber without breaking
the vacuum.
3.2 STM Design
ThedesignoftheSTMwasgeometricallyrestricted bythe62mmdiameter
of the magnet's core tube. The cylindrical body of the STM, machined
from one piece of the glass ceramic Macor [47] has a diameter of 40 mm
and a height of 110 mm. This body bears all parts of the microscope. It
is mounted on top of an OFHC copper pedestal which serves both as the
microscope's supportandasthethermal anchoringfor allelectricalwirings.
Togetherwiththisstandthemicroscopeisinstalledasaunitintothemagnet
a b
c
d
e
f
f
g
h
Figure 3.3: Photographof themicroscopeon itspedestal. (a) Macor body, (b)
sapphire prism, (c) leaf spring, (d) tube scanner with tip, (e) sample, (f)
ther-malanchoringofelectricalleadsto heliumandnitrogentemperature,respectively.
a
b
c
d
e
f
g
c
f’
h
i
l
n
z
x
y
m
c’
c’
e’
k
Figure 3.4: Schematic drawingof theSTM (not to scale). (a) Macor body, (b)
sapphireprism,(c) and (c') shearpiezo stacks,(d)Macor beam,(e)and (e') ruby
ball,(f)and(f')leafspring,(g)scannerwithtip,(h)statorsforsamplerotation,(i)
rotorwithsample,(k) spring,(l)temperaturesensor,(m)leafspring,(n)bridge.
beryllium.
3.2.1 Approach Mechanism
At the center of the microscope one nds two moving parts, the approach
sledge bearing the scanner tube at its lower end [(b) in Fig. 3.4], and the
samplerecectacle (i)which canberotated about they-axis. Thecoarse
ap-proachmechanismisbasedonPan'sdesign[48]thathasproventobestable
enough to regain a microscopic location on the samplewith an accuracyof
lessthan100nmposteriortoamacroscopicmovementof20mm[49,50]. The
approach sledge is a polished sapphire prism placed in a V-shaped groove
where it is rigidly clamped by two triplets of shear piezo stacks [51] [(c) in
Fig. 3.4]. A 5 mm 5 mm 1 mm Al
2 O
3
pad is glued on top of each
shearpiezo stack. These padsprovide the actual contact areas between the
stacks and the sapphire prism surfaces. Two of the piezo stacks are glued
to aMacorbeam(d)which ispressedonto theprismby meansof a
molyb-denum leaf spring (f) and a ruby ball (e). The Macor beam functions as
a balance and thus warrants an equal distribution of thespring force to all
contactareasofthesixshearpiezostacksandtheprismsurface. Incontrast
topreviouslypresenteddesigns[52 54]wedonotemploywalkersteppingas
aworkingmechanismbutuseinertial movement byapplyinganasymmetric
saw-tooth voltage curveto all sixstackssimultaneously (stick-slip). Onthe