“Protective Thin Films against Liquid Metal Embrittlement” Olga Dousset Universita' Degli Studi Di Padova, Istituto Di Fisica Nucleare

c ISIS Facility, Rutherford Appleton Laboratory, Chilton, Didcot OX11 0QX, UK Reprint requests to Dr. This indicates the formation of NdO n polyhedra not sharing any O atom where

The analysis of the errors in individual sublayers of a homogeneous model stress distribution shows that the in fl uence of these three parameters depends strongly on the position of

For most grain interaction models, this dependence on ~ g results in a full set of compliance tensors for each angle combination (φ, ψ). Moreover, a sim- plified stress state, as

Reactive sputter deposition is used to deposit chemical compounds, such as oxides, nitrides, carbides and sulfides when sputtering metallic targets [23]. The

film thickness). This, however, usually was performed in one dimension without knowledge of the real surface. Therefore, a detailed STM analysis of the thin-film

The rms amplitudes between carbon and hydrogen are mostly in fair agreement with the calculated values within their uncertainties.. For those between carbon atoms,

In combination, these three components give a very detailed and clear picture of the candidate‟s advertisement strategy (KAID 2002). With regard to the verbal content, Gore

A corrector employed in scanning transmission electron microscopy (STEM) allows us to form an electron probe with a diameter of less than 0.1 nm and use it to