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Thermopile effect due to laser radiation heating in thin films of high-To materials PHYSICA

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Physica C 235-240 (1994) 37-40

North-Holland

PHYSICA

Thermopile effect due to laser radiation heating in thin films of high-To materials

K.F. Renk, J. Betz, S. Zeuner, H. Lengfellner, and W. P r e t t l

Institut fiir A n g e w a n d t e Physik, Universit~t Regensburg, D-93040 Regensburg, G e r m a n y We r e p o r t on the observation of a thermopile effect caused by laser radiation h e a t i n g in thin films of high-To material. T h e thermopile effect is due to a transverse Seebeck effect. T h e transverse Seebeck effect is observable first because of the anisotropy of YBa2Cu3Or-6, and secondly because it is possible to grow off-axis epitaxial films. T h e thermopile effect can be used for developing detectors for laser radiation.

I. I n t r o d u c t i o n

Various groups have observed voltaic sig- nals of laser irradiated YBa2Cu307-6 (YBCO) films [1 - 4]. T h e r e were speculations about t h e origin. It was discussed t h a t a photo- electric [5] or a piezoelectric or a pyroelec- tric [6] effect m a y play a role. Recently, it was d e m o n s t r a t e d t h a t the m a i n effect of the voltaic signal is due to a transverse Seebeck effect [4, 7, 8]. In Y B C O films one can ob- serve, to our knowledge for t h e first time, this thermovoltalc effect.

I I . T h e t r a n s v e r s e S e e b e c k e f f e c t T h e transverse Seebeck effect can be ob- served for a Y B C O film on s t r o n t i u m ti- t a n a t e , t h a t has the c-axis not perpendicular to the surface of the film b u t with the c-axis tilted, i.e. t h e ab-plane is not parallel to the film surface, but tilted (Fig. 1). Such films can be grown by laser ablation using a sub- s t r a t e t h a t is cut in an appropriate way. Ir- radiation of a film at r o o m t e m p e r a t u r e with a laser pulse can result in a signal t h a t can reach values up to 200 V (Fig. 1). T h e ori- gin is a transverse Seebeck effect. While laser

0921-4534/94/$07.00 © 1994 - Elsevicr Science B.V. All rights SSDI 0921-4534(94)00648-2

irradiation results in a t e m p e r a t u r e gradient perpendicular to the film surface a thermo- electric voltage is observed across the film - the thermoelectric voltage is perpendicular to the t e m p e r a t u r e gradient.

Laser radiation is absorbed in the upper part of the film and creates a t e m p e r a t u r e gradient within the film. T h e h e a t in the film escapes into t h e s u b s t r a t e within a time of about 200 ns. One m a y describe t h e device as an atomic layer thermopile because cop- per oxide layers and t h e interlayers between the copper oxide layers represent atomic ther- moelements connected in series. T h e area is 10 m m x 10 m m and the thickness of the film about 3000/~.

If one reverses the t e m p e r a t u r e gradient by shining light not from t h e free film surface but from the side of the ( t r a n s p a r e n t ) sub- strate side, t h e n t h e signal is reversed.

Instead of a laser b e a m we have also used a t h e r m a l source and could also observe ther- moelectric signals [4, 7].

Usually one deals with the longitudinal thermoelectric effect. If we apply a temper- a t u r e gradient along t h e c-axis of an Y B C O crystal t h e n we find a t h e r m o e l e c t r i c field

reserved.

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38 K.I( Renk et a/./ Phvsica (" 235 240 (/994) 37 40

laser pulse

'

'

1 1

! !

I I

I

m

atomic layer thermopile

o

200

100

0 200 bOO 600

time ( ns )

J

Figure 1. A t o m i c layer thermopile

= - T 1 ) / d

where Sc is t h e Seebeck coefficient for the c- direction of Y B C O , 7'2-7"1 is the t e m p e r a t u r e difference a n d d t h e sample thickness. If we apply a t e m p e r a t u r e gradient along t h e ab- plane, t h e n the t h e r m o e l e c t r i c field which is created within t h e sample is characterized by a Seebeck coefficient S~b. It turns out t h a t by doping the film Sob can be smaller t h a n So.

S~b depends strongly on the oxygen concen- t r a t i o n 6 a n d can be negative or positive; for f u r t h e r discussion we assume Sob = 0. If we now have a film with the c-axis at an angle a with respect to t h e film surface, then a tem- p e r a t u r e gradient p e r p e n d i c u l a r to the film surface is effective only along the c-direction a n d we will have a thermoelectric field along the c-direction which is p r o p o r t i o n a l to the c o m p o n e n t of t h e t e m p e r a t u r e gradient along

the c-direction, V T cos a.

This electric field Ec now has components, a longitudinal c o m p o n e n t Elo~g which is par- allel to the t e m p e r a t u r e gradient a n d a trans- verse c o m p o n e n t which is transverse to the t e m p e r a t u r e gradient. T h e transverse com- ponent has a value.

Etrans = S c V T sin ol cos a

Accordingly, we obtain a transverse voltage Utro,~s along the film surface

Um,,~s = l/d(T2 - T1 )So cos a sin a

where I is the separation of the electrical con- tacts. In case t h a t Sob is not zero, Sc in the last equation has to be replaced by Sc - S~b.

For l = 1 cm and assuming a large tempera- ture difference t h a t can be g e n e r a t e d by laser irradiation, n a m e l y of 300 K over 10 . 5 cm,

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K.E Renk et al./Physica C 235-240 (1994) 37-40 39

o c

_Q

Q 0 e

I I e-

I t I I

0 5 10 15 20

tilt angle ,-, ( degrees ]

Figure 2. T h e r m o e l e c t r i c signals for YBCO films of different tilt angles [7].

a difference of the Seebeck coefficient of 10 -5 V / K and cos a sin a = 1/3 we find t h a t the transverse voltage can reach a value of ,- 100 V.

T h e transverse voltage is proportional for small a directly to a. This is indeed found ex- perimentally (Fig. 2). Thermoelectric signals for different films of different tilt angles show, t h a t the thermoelectric voltage increases al- most linearly with angle a , up to a tilt angle of 20 ° . T h e e x p e r i m e n t clearly shows t h a t the transverse t h e r m o e l e c t r i c voltage due to the transverse Seebeck effect depends on the ge- ometric a r r a n g e m e n t of the YBCO films rel- ative to t h e film surface.

T h e r e are two aspects of these results. A small t h e r m o e l e c t r i c signal indicates a good orientation of t h e c-axis perpendicular to the film plane. For larger tilt angles the film is suitable as d e t e c t o r for optical radiation.

We have studied the response of the detec- tor for different film thicknesses. The film thickness determines t h e heat diffusion from

the film to the substrate. For small thick- ness the heat escapes fast, for thicker films the heat takes longer time to escape from the film. We have observed (Fig. 3) laser pulses of a C02-1aser with short spikes due to mode locking. For a 40 n m thick film the spikes are well resolved. T h e heat escapes in a few ns from the film into t h e substrate.

The response time is few ns. For a film of larger thickness the thermovoltaic signal does no longer resolve t h e single laser pulses since the heat escapes slower from t h e film and ac- cordingly, the time constant is larger. For a 300 n m thick film the time c o n s t a n t is about 100 ns.

I I I . C h a r a c t e r i s t i c d e t e c t o r d a t a

We have found t h a t the d e t e c t o r is suitable to detect radiation in a very large wavelength range. It responds to UV radiation, to visible radiation, to infrared radiation at 10 # m and to far infrared radiation and even to radiation at millimeter waves. T h e d e t e c t o r can be used for detection of pulsed or cw radiation.

The signal increases almost linearly with laser power. A d y n a m i c a l range t h a t extends over m o r e t h a n 10 orders of m a g n i t u d e has been found [7]. So the d e t e c t o r has an ex- tremely large d y n a m i c a l range.

We have built an a r r a y with strips, each with an electric connection for signal record- ing. Irradiation of the strips with laser radi- ation results in different signals. By this way we can determine profiles of laser radiation in one direction. By moving a slit in the o t h e r direction we have d e t e r m i n e d the profile of laser radiation in t h e plane of the b e a m . This m e t h o d allows to adjust e.g. cw-CO2 lasers or other lasers. T h e m e t h o d represents a fast and simple way of laser controlling.

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40 K.E Renk et al./Physica C 235-240 (1994) 37-.40

w

0 ¢::

50 100

time [ ns )

150

Figure 3. Response time of atomic layer ther- mopile [9]

I V .

Summary

Off-axis grown epitaxial YBCO films show a transverse Seebeck effect that is due to the anisotropy of YBCO. We have demonstrated the application of the effect for developing an optical radiation detector. The detector has a responsivity of about 1 m V / W , a response time depending on film thickness between 1 ns and 100 ns. The detector has an extremely large dynamical range. It responds to radia- tion over a very large wavelength range. It is suitable to detect millimeter wave radiation, infrared radiation, visible light and ultravi-

olet radiation. In the ultraviolet it is espe- cially suitable to detect excimer laser radia- tion. The detector can be applied for laser power measurements and also for laser beam profiling. The main application may be in contolling of lasers in material processing and medicine.

The work was supported by the Bayerische Forschungsstiftung through the Bayerischer Forschungsverbund Hochtemperatur- Supralei- ter (FORSUPRA).

R e f e r e n c e s

[1] C.L. Chang, A. Kleinhammer, W. G.

Moulton, and L.R. Testardi, Phys. Rev.

B 41, 11564 (1990).

[2] K.L. Tate, R.D. Johnson, C.L. Chang, E.F. Hilinski, and S.C. Foster, J. Appl.

Phys. 67, 4375 (1990).

[3] H.S. Kwok and J.P. Zheng, Phys. Rev.

B 46, 3692 (1992).

[4] H. Lengfellner, G. Kremb, A. Schnell- bhgl, J. Betz, K.F. Renk and W. Prettl, Appl. Phys. Lett. 60,501 (1992).

[5] J.F. Scott, Appl. Phys. Lett. 56, 1914 (1990).

[6] D. Mihailovic and A. Heeger, Solid State Commun. 75,319 (1990).

[7] H. LengfeUner, S. Zeuner, W. Prettl and K.F. Renk, Europhys. Lett. 25, 375 (1994).

[8] L.R. Testardi, Appl. Phys. Lett. 64, 2347 (1994).

[9] P.G. Huggard, S. Zeuner, K. GoUer, H.

Lengfellner and W. Prettl, J. Appl. Phys.

75, 616 (1994).

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