The timing reference for the MuPix8, developed in the scope of this thesis, consist of scintillating tiles with SiPMs, which are read out by a PCB. The scintillator material BC-408® [47] by Saint-Gobain Crystals® which is cut into 20 mm×20 mm×4 mm tiles.
This means that the tile is bigger than the MuPix8 but has the right scale for a final Mu3e sensor [18]. The used SiPMs are MPPC S13360-3050CS® [48] from Hamamatsu Photonics K.K.® with a sensitive area of 3 mm×3 mm and a pixel pitch of 50µm. To prevent the loss of light due to the size difference, the tile is wrapped in a mantle of an aluminum polyimide laminate which reflects the light from all surfaces except the inter-face of the SiPM. The mechanical frame is custom 3D-printed and made out of black material to shield more light. The light tightness is further improved by black vinyl tape and black acrylic paint.
For testbeam measurements at beams with a hadronic component also tiles with acrylic light guides were fabricated. For this thesis only tiles without light guide were used.
In Fig. 7.10a, a fully assembled tile with rectangular light guide is shown next to the components for a tile with trapezoidal light guide, the aluminum polyimide laminate reflective mantle, the quadratic tile with the light guide and the 3D-printed frame.
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The tile PCB [49] allows to connect one tile for direct analog output or up to two tiles with a logic output. The PCB has two comparator channels with individual thresholds and NIM outputs. If desired they can also be set in coincidence by a fast AND on the board. For this thesis only one tile per PCB was used. Fig. 7.10b shows a tile without light guide attached to the back of a tile PCB.
To test the time resolution of this reference system, two tile boards, each equipped with a tile, are mounted on top of each other and are exposed to a Sr90 source. The de-lay between the channels is measured and histogrammed by an oscilloscope (Tektronix DPO 7254C [50]). The standard deviation of this histogram is the time resolution. This measurement is done at two bias voltages for the SiPMs at comparator thresholds of 30 mV to 35 mV. The result is summarized in Tab. 7.4. The resolution of a single tile, assuming that both tiles have roughly the same resolution, is then given by Eq. 7.4 which is roughly 1.4 ns. This is consistent with results in Ref. [51] for scintillator strips of a similar material and SiPMs of the same type.
Tile HV [V] Coincidence Time Resolution [ps]
54.5 2185.9±3.9
55 2006.8±4.3
Table 7.4: Time resolution for two tiles in coincidence
σ2total=σ12+σ22 σ1 ≈σ2
σ≈√
2·σtot (7.4)
(a) Fully assembled tile with light guide and components.
(b) Tile without light guide mounted to the back of the tile PCB.
Figure 7.10: Tile components and fully assembled tile.
Part III
Measurements
8 Analog Measurements
In this chapter the analog performance of the MuPix8 amplifier cell, Sec. 7.1.1, is mea-sured and discussed. The impact of the multiple DACs which steer the amplification and shaping is investigated.
8.1 Setup
The measurements in the following have been made using an oscilloscope (Tektronix MSO 4104 [52] and Tektronix DPO 7254C [50]) and the analog outputs of the MuPix8 and the PCB. The trigger is given by the falling edge of the injection. It is generated on the PCB and terminated by 1 MΩ, otherwise the current charging the capacity would flow into the oscilloscope instead of the pixel. The hitbus is also tapped on the PCB and is terminated by 50Ω. The AmpOut can only be measured at test points on the insert.
It is measured with an active probe and a termination resistor of 1 kΩ. The bandwidth of the probe is set to 20 MHz to reduce the impairments of high frequency noise. As the AmpOut level depends on the selected pixel and the setting of the DACs and reference voltages, the amplitude is measured as difference between the maximum and the low level of the waveform. The minimum is not used because of noise and an undershoot at the end of the pulse. Rise and fall time are either measured as time difference between the 10% and the 90% points of the waveform or as time difference between the crossing of fixed voltages. All values are transformed into slew rates in mV/ns. The measured ToT is defined by the 50% crossings of the hitbus. An example of an Fe55 pulse is found in Fig 8.1a where the measurement variables of the AmpOut are annotated. An injection gauged to a Fe55 signal can be seen in Fig. 8.1b.
At least 2000 samples are taken for all measurement points which gives a statistical error of 2.2% or less. Errors given for a measurement point in this section, are either the standard deviation of the measurement of the oscilloscope or derived from it. Since both the AmpOut and the hitbus have driving circuits which influence the output, the data is investigated with respect to relative changes rather than absolute ones.
Max
Low
Amplitude
Undershoot 90%
10%
Rise Time
Fall Time
(a) Fe55 pulse. (b) Fe55 gauged injection.
Figure 8.1: Examples of measured waveforms. The AmpOut is shown in red, the hitbus in green and the injection in blue.
Amplifier
Chip Insert PCB
Injection Generator
Oscilloscope Comp2
Figure 8.2: Block diagram of the measurement setup.
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