• Keine Ergebnisse gefunden

Properties of modern scintillators compared by nuclear and electron microscopy methods

N/A
N/A
Protected

Academic year: 2022

Aktie "Properties of modern scintillators compared by nuclear and electron microscopy methods "

Copied!
2
0
0

Wird geladen.... (Jetzt Volltext ansehen)

Volltext

(1)

Properties of modern scintillators compared by nuclear and electron microscopy methods

P. Horodysky1, J. Jiruse2, V. Nedela3, and J. Spinka4 1. Crytur, Palackeho 175, Turnov 51101, Czechia 2. Tescan, Libusina trida 21, Brno 62300, Czechia

3. Institute of Scientific Instruments of the ASCR, Kralovopolska 147, Brno 61264, Czechia 4. Faculty of Electrical Engineering and Communication, Brno University of Technology,

Udolni 53, Brno 60200, Czechia horodysky@crytur.cz

Keywords: SEM, scintillator, detection efficiency

In recent decades, single crystalline scintillators have proven their potential for use in standard and high-end electron microscopes. They offer high frequency operation, low noise and extremely good resistance to radiation damage. The market share of classical BSE and SE detectors is of about 80% and 30% respectively. For a long time, the single-crystalline scintillators used in electron microscopy were based almost uniquely on cerium doped yttrium aluminates: yttrium aluminium garnet (YAG) and yttrium aluminium perovskite (YAP) [1]. Up to now, the “read out” of the scintillator in scanning electron microscopy (SEM) is done using a photomultiplier tube (PMT) typically with a bialcali photocathode.

Unfortunately, scintillation emission of YAG:Ce and YAP:Ce crystals is shifted quite a lot towards red and blue respectively compared with the spectral sensitivity of the PMT.

This contribution discusses and compares properties of new coming scintillation materials like CRY018 and others. New materials offer relative increase of detected signal by a factor of about two compared to classical YAG:Ce or YAP:Ce materials. The detection efficiency is studied simultaneously by nuclear methods (multichannel analysator) and by measurements in an electron flux in an SEM. State of the art performance of single crystal detectors for electron microscopy will be presented.

1. R. Autrata et al., Scanning Electron Microsc. 11 (1983) p489.

I5.P527 - 207 - MC2009

G. Kothleitner, M. Leisch (Eds.): MC2009, Vol. 1: Instrumentation and Methodology, DOI: 10.3217/978-3-85125-062-6-102, © Verlag der TU Graz 2009

(2)

MC2009 - 208 - I5.P527

G. Kothleitner, M. Leisch (Eds.): MC2009, Vol. 1: Instrumentation and Methodology, DOI: 10.3217/978-3-85125-062-6-102, © Verlag der TU Graz 2009

Referenzen

ÄHNLICHE DOKUMENTE

At the Department of Applied Physics at Chalmers University of Technology different electron microscopy techniques and atom probe tomography (APT) are used to

compartment. In addition, TGN and Golgi associated transport vesicles like CCV, COPI and COPII vesicles are difficult to visualize in resin embedded samples as well as in

Keywords: light microscopy, electron microscopy, correlative microscopy, integrated laser electron microscope (ILEM), thin-section, immunolabelling.. Correlative microscopy

To obtain a distribution map of a certain element one can acquire (i) a sequential series of EELS spectra from different positions on the specimen (EELS spectrum imaging)

In the frame of the increasing activity on nanoscale electronic and optical devices a high number of doped and undoped ZnO elongated nanostructures, such as wires, rods or

For investigating the magnetic structure, we need a ’polarizer’ which would select the projection of the neutron spin on the quantization axis (which is the direction of

Average particle size was evaluated by Debye-Scherrer’s formula and compared with size-distribution statistics taken from an image analysis of transmission electron

The SAED pattern (c’) from the thinnest fiber showed more developed orientation than the thicker one (b’), and many high- order reflections including the 002 reflections on