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High-Resolution Lithography

Serial writing and parallel printing of nanostructures

Technology Transfer R&D Services

P A U L S C H E R R E R I N S T I T U T

Introduction

A large number of lithographic techniques have been developed for the lateral struc- turing of surfaces on the micro- and nanom- eter scale.

For industrial mass production, photo- lithography is usually applied, due to its very high throughput and resolution capa- bility below the 100 nm range. However, low volume production, or applications in R&D, often require a higher degree of flex- ibility or even better resolution.

PSI operates a state-of-the art electron- beam lithography (EBL) tool for the flexible writing of micro- and nanostructures with dimensions down to the 10 nm range. In addition, the fast parallel printing of peri- odic nanostructures with similar resolution is provided by interference lithography us- ing extreme ultra-violet radiation (EUV-IL).

Nanolithography services

PSI’s Laboratory for Micro- and Nanotech- nology and its spin-off company Eulitha AG at Villigen offer expertise in both techniques for external customers, including:

• Consulting regarding nanofabrication

• Sample and data preparation

• Exposures, including pre- and post- processing steps

The range of applications for e-beam litho- graphy is extremely wide. PSI offers broad experience in employing e-beam lithogra- phy, in particular for:

• Stamp origination for nano-imprint lithography

• the fabrication of diffractive optical ele- ments (DOE)

• High-aspect ratio moulds for electro- forming

Figure 1: High-resolution Vistec EBPG5000Plus direct-write electron-beam lithography tool in a dedicated, class 100 clean room.

Figure 2: 3D lithography in PMMA for nano-imprint stamp origination.

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• The production of photomask manufac- ture

• The low-volume production of semicon- ductor components for many other R&D projects.

The E-beam writing tool at PSI

The Vistec EBPG 5000Plus direct-write tool has been in operation since March 2009. It is among the best Gaussian-shaped e-beam tools world-wide.

The key features of this tool are:

• Electron energy of 100keV enabling exposure of high aspect-ratio structures

• Rapid exposures provided by an intelligent pattern generator

• Substrate size up to 150 mm width

• Excellent resolution, stitching and overlay accuracy

• Continuously variable writing grid for accurate exposure of periodic structures

EUV interference lithography

Extreme Ultraviolet Interference Lithography (EUV-IL) is a revolutionary technology for the high-throughput fabrication of periodic nano-patterns developed at PSI. Eulitha – a spin-off company of PSI – provides nano- structured products based on this new tech- nology.

In EUV-IL, a coherent EUV beam ob- tained from the Swiss Light Source is used to create an interference fringe pattern. A photoresist-coated substrate is exposed to this beam and processed, resulting in resist nanostructures. Thanks to the short wave-

length (ca. 13 nm) of the EUV light, the structures produced have extremely high resolution, below the 20 nm scale. While the same resolution can be achieved with state-of-the-art EBL machines, the higher throughput of EUV-IL means that it can be employed to cover large areas with nano- structures that would be unaffordable with EBL.

Applications of Eulitha’s products include:

• Nano-imprint process development

• Patterned magnetic media

• Microscopy calibration samples

• Templates for self-assembly

• Nanophotonics

• Templates for assisted self assembly

Figure 3: High aspect-ratio split-ring resonators for plasmonic biosensing applications, made of electroplated gold.

SYN-F19-D-10, 10. 2010

Figure 4: Periodic nanostructures fabricated by EUV-IL: 25 nm half-pitch grating etched in Si (top) and 45 nm half-pitch hole array (below).

Contact

Dr. Vitaliy Guzenko e-beam lithography Tel. +41 (0)56 310 54 36 vitaliy.guzenko@psi.ch Dr. Harun Solak Eulitha

Tel. +41 (0)56 310 42 79 www.eulitha.com Paul Scherrer Institut

5232 Villigen PSI, Switzerland Tel. +41 (0)56 310 21 11 www.psi.ch

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