Adsorpation of thin liquid helium films on Cs measured via photoelectron tunneling

For liquid crystal films on substrates, this work presents thin films of 8CB on silicon wafers. Despite the numerous studies of this material-substrate combination, no

For this reason we have established a new set-up which allows such experiments: via a surface tunnelling microscope, with large scanning facility and working at low temperature, we

The film thickness was about 20 nm……… 67 6.1 The variation of the pick-up current as the helium level drops (this procedure called pump-run) is shown. This process corresponds

In that work, 6 the contributions of electron–electron interac- tion and vapour-atom motion were separated, but direct evidence that the interaction of the electrons with the

δ(x) is the corrugation profile (a + b) is the corrugated structure period, and ζ (x) is the profil of the helium film R is the radius of curvature of the capillary condensed

Here the the channel is short (2µm), the helium film thickness ≈ 50nm and the average of the intial number of saved electrons before pulsing the gate is 4.5 ∗ 10 7 electrons.. 6.6

In this thesis, we model the dynamics of two-dimensional electron sys- tems (TDES) on deformed superfluid liqui helium (LHe) films that wet a periodically structured surface

15 The measurement of the advancing contact angle on a horizontal Cs surface shows a temperature dependence similar to that when there is strong pinning, 6 but when liquid is